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Smart card testing device for set-top box

A test device and set-top box technology, applied in TV, electrical components, image communication, etc., can solve the problems of non-wear-resistant chip copper skin, high test cost, waste of resources, etc., to avoid wear, improve work efficiency, and reduce costs Effect

Inactive Publication Date: 2015-04-08
惠州大亚湾浦锐斯顿电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

During the test, the smart card is tested by touching the card holder of the set-top box through the chip copper inside. Since the chip copper is not wear-resistant, if a card is tested on about 1,000 machines, the copper will wear out and the card can only be scrapped. , leading to waste of resources, high cost of enterprise testing, and low efficiency through plug-in card testing

Method used

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Embodiment Construction

[0013] The content of the present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments. The accompanying drawings are only for illustrating the structure of the present invention, and there is no limit to the size. In order to clearly see the structure, the proportions of the front view and the back view are also different.

[0014] Such as figure 1 , 2 As shown, the high-efficiency set-top box smart card testing device of the present invention includes a substrate 10, on which a smart card holder 12 and a simulated card copper sheet 14 are arranged, and the signal contacts on the simulated card copper sheet 14 and the smart card holder 12 pass through a circuit 16 One-to-one connection.

[0015] The substrate 10 is a double-sided printed circuit board, its width corresponds to the set-top box smart card, and its length is slightly longer than the smart card. The smart card holder 12 is arranged on one end of the f...

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Abstract

The invention relates to a smart card testing device for a set-top box. The smart card testing device comprises a card type substrate, and a smart card holder and analogue card copper sheets arranged on the card type substrate, wherein the analogue card copper sheets are correspondingly connected with signal contacts in the smart card holder one by one through circuits; the card type substrate is a strip-shaped printed circuit board of which the width corresponds to the width of a smart card of the set-top box; the smart card holder and the analogue card copper sheets are arranged at the two ends of the printed circuit board respectively, positioned on different sides of the circuit board, and connected with each other through an etching circuit; and the analogue card copper sheets are copper foil patterns formed by etching. Through adoption of the smart card testing device in functional testing of the smart card in cooperation with the set-top box, wear of the smart card is avoided, and card purchasing cost is saved for enterprises. The cost is reduced; the testing device can be replaced at any time in case of poor contact after wear; the repeated testing times of the card can be reduced; and the working efficiency is increased. Meanwhile, greater convenience is brought to plugging during testing, and the production testing efficiency is increased greatly.

Description

technical field [0001] The invention relates to the field of electronic communication equipment, in particular to a set-top box smart card testing device. Background technique [0002] All set-top boxes are equipped with smart cards, and the manufacturers of set-top boxes must test the function of the smart cards on the set-top boxes. In mass production, it is impossible to equip each machine with a test card, and the manufacturer generally buys several for testing. During the test, the smart card is tested by touching the card holder of the set-top box through the chip copper inside. Since the chip copper is not wear-resistant, if a card is tested on about 1,000 machines, the copper will wear out and the card can only be scrapped. , leading to waste of resources, high testing costs for enterprises, and low efficiency through plug-in card testing. Contents of the invention [0003] In view of this, the problem to be solved by the present invention is to provide a set-top...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/04
Inventor 詹海鸿
Owner 惠州大亚湾浦锐斯顿电子有限公司