Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Light-emitting diode and laser diode open circuit fault detection circuit

A technology of laser diodes and light emitting diodes, applied in the field of circuits, can solve problems such as open circuit fault information cannot be transmitted in real time, unfavorable equipment operation and maintenance, etc., and achieve low power consumption and concise circuits

Active Publication Date: 2015-04-08
NO 717 INST CHINA MARINE HEAVY IND GRP
View PDF3 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When no one is on duty outdoors, the open circuit fault information cannot be transmitted in real time, which is a great disadvantage to the operation and maintenance of the equipment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Light-emitting diode and laser diode open circuit fault detection circuit
  • Light-emitting diode and laser diode open circuit fault detection circuit
  • Light-emitting diode and laser diode open circuit fault detection circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0026] figure 1 It is a schematic block diagram of the present invention, including four components, including a front-end constant current signal extraction and processing circuit 100 , a PWM dimming signal extraction circuit 200 , a digital level conversion circuit 300 , and an alarm and open circuit protection circuit 400 . Further details of these circuits may be illustrated and described in this specification.

[0027] The front-end constant current signal extraction and processing circuit 100 includes a differential amplifier circuit 110 and a differential output voltage signal buffer circuit 120 . The differential amplifier 110 can extract the potential difference at both ends of the current sampling resistor in a relatively high common-mode voltage environment, and amplify it to a certain extent. exist figure 2 In the illustrated embodiment, when the reference voltage of the differential amplifier is grounded, its differential output voltage signal is in-phase and p...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the field of circuits, and particularly relates to a light-emitting diode and laser diode open circuit fault detection circuit comprising a front-end constant current signal extraction and processing circuit; a PWM dimming signal extraction circuit; a digital level conversion circuit; and an alarm and open circuit protection circuit. The light-emitting diode and laser diode open circuit fault detection circuit does not depend on a certain specific type of switch power supply topological form, and the topology is suitable for the light-emitting diode and laser diode open circuit fault detection circuit if the topology can drive an LED / LD in a constant current way. A current acquisition resistor adopted in the circuit is mutually connected in series with the LED / LD with no requirement for assigning the resistor to be positioned at the high side of the circuit or the low side of the circuit so as to be quite flexible. With application of the form of the circuit, a specialized LED / LD open circuit fault detection chip is easy to construct, and the circuit is easy to be integrated in a certain LED / LD driving chip with an open circuit fault detection function. The light-emitting diode and laser diode open circuit fault detection circuit has advantages of low power consumption and concise circuit regardless of implementation modes.

Description

technical field [0001] The invention relates to the field of circuits, in particular to a light-emitting diode and laser diode open-circuit fault detection circuit. Background technique [0002] Because LED has outstanding advantages such as high brightness, high luminous efficiency, and long life, it replaces traditional lighting devices in more and more fields. In airport navigation aids, railway signal lights, road traffic lights and other outdoor places where LEDs are used as lighting / indicating light sources, because they need to operate with high reliability under unattended conditions, it is required to be able to detect LEDs in real time in specific applications. Single series / multiple series) whether it is in a normal constant current state or an open circuit state. In laser TVs, laser dazzlers and other occasions that also require constant current drive, it is also required to be able to detect in real time whether the LD (or its single series / multiple series) is ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H05B37/03
Inventor 赵翔耿安兵
Owner NO 717 INST CHINA MARINE HEAVY IND GRP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com