Non-mounted memory test device based on fpga

Abstract

The invention relates to a non-mounted storage test device based on FPGA. The non-mounted storage test device based on FPGA comprises a processor unit which executes enumeration and configuration, produces a scene and sets a device drive unit; the device drive unit which communicates with a host bus adapter; a data engine unit which generates mode data, accesses data stored by a user from a system memory and carries out a test; a system memory interface unit which receives the data needed by the process and stores a test result; a monitoring unit which monitors and stores a data packet of a PCIe processing layer; a direct memory access drive / address conversion unit through which all data flows execute direction memory access actions and send memory reading requests to a root complex if the device drive unit decodes the scene and transmits a command to the host bus adapter; an information input output unit which transmits interpreted results of the direct memory access drive / address conversion unit to the data engine unit and the device drive unit; a PCIe IP unit which serves as SW IP of the PCI Express logic; a switch unit; a tested device unit; and a memory unit.

Description

technical field [0001] The present invention relates to a driving mechanism using a PCI Express (PCIe)-based solid-state hard disk test (SSD TEST) device, and in more detail, to a field-programmable gate array (FPGA)-based PC-based non-mountable test set. Background technique [0002] Now, Solid State Drive (SSD) in High Speed ​​Storage has attracted much attention. Among them, PCI Express-based solid-state drives have a large amount of communication processing capacity compared with SAS SATA, so they are not only expanded to enterprise servers such as data centers, but also to the personal solid-state drive market. [0003] On the other hand, in addition to Korean Patent Laid-Open No. 10-2010-011469 (hereinafter referred to as "Prior Art Document"), there are many applications and publications concerning devices for testing memory. [0004] The prior art includes: a memory interface part that maintains a connection with a memory (storage); a user interface part that recei...

AI Technical Summary

Problems solved by technology

[0007] And, in the case of the installation-based test environment, there is a problem that the response time and test time of the command processing for the test device driver are prolonged compared to the installation-based test environment

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