Method for modifying properties of graphene

An adjustment method and graphene technology, applied in chemical instruments and methods, inorganic chemistry, electrical components, etc., can solve the problems of graphene film damage, semiconductor film structure damage, inappropriate semiconductor characteristic adjustment methods, etc., to simplify the manufacturing process, The effect of reducing industrial costs

Inactive Publication Date: 2015-04-29
METAL INDS RES & DEV CENT
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Problems solved by technology

Among them, the existing thermal diffusion method uses high temperature (≧500°C) to drive the atoms to be doped to diffuse in the semiconductor film and the substrate (combined with the semiconductor film); however, the existing thermal diffusion method must be Carried out in a high temperature environment, it is easy to cause damage to the semiconductor thin film structure
However, the existing ion implantation method uses high voltage to cause ionized elements to collide and then physically replace them; however, although the existing ion implantation method avoids high-temperature environments, the ionized elements collide with each other. , causing great damage to the semiconductor thin film structure, so it needs to be repaired by annealing
[0004] Although the above-mentioned existing semiconductor characteristic adjustment methods can adjust the structural characteristics of the semiconductor thin film, the thickness of graphene is only about 0.34 nm. Severe damage, so it is not suitable for these semiconductor characteristic adjustment methods
[0005] In addition, the above-mentioned existing semiconductor characteristic adjustment methods need to place the entire semiconductor thin film in a high-temperature or high-voltage environment, and it is difficult to adjust the characteristics of a small-area graphene thin film.

Method used

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Embodiment Construction

[0021] In order to make the above-mentioned and other objects, features and advantages of the present invention more comprehensible, the preferred embodiments of the present invention are specifically cited below, together with the accompanying drawings, as follows:

[0022] The graphene characteristic adjustment method of the present invention includes: a graphene film providing step and a modifying step to obtain a graphene material.

[0023] In detail, the graphene film providing step is to provide a graphene film, which is formed on a substrate, wherein the substrate can be the surface of an electronic component or transistor to which the graphene is to be attached, and its material can be Silicon, glass or plastic, without limitation.

[0024] Graphene can be formed on the substrate by any means, for example, it can be formed on the substrate by chemical vapor deposition, physical vapor deposition or mechanical stripping. The above-mentioned methods are common methods in ...

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Abstract

A method for modifying properties of graphene includes a graphene film provision step and a modification step. In the graphene film provision step, a graphene film is provided, and the graphene is formed on a substrate. In the modification step, the graphene film is placed in a vacuum environment and radiated by an electron beam to obtain a graphene material.

Description

technical field [0001] The invention relates to a graphene characteristic adjustment method, in particular to a graphene characteristic adjustment method for changing graphene semiconductor characteristics. Background technique [0002] Graphene is a flat film with a hexagonal lattice. It is a two-dimensional material with a thickness of only one carbon atom (about 0.34 nm). Graphene not only has high mechanical strength, thermal conductivity, and high carrier transfer rate. Characteristics, through the adjustment of semiconductor characteristics, can be used to develop thinner electronic components or transistors with faster conduction speed. [0003] Existing semiconductor characteristic adjustment methods can be divided into thermal diffusion method and ion implantation method. Among them, the existing thermal diffusion method uses high temperature (≧500°C) to drive the atoms to be doped to diffuse in the semiconductor film and the substrate (combined with the semiconduc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C01B31/04
CPCB01J19/085C01B32/194H01L21/02527H01L21/02664
Inventor 黄家宏朱继文邱松茂王俊杰魏嘉民锺崇仁吴伯雄
Owner METAL INDS RES & DEV CENT
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