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Method for Offline Locating Continuous Dead Pixels of Image Sensor Chip

A sensor chip and positioning image technology, which is applied to electrical components, circuits, semiconductor/solid-state device testing/measurement, etc., can solve the problems of low test efficiency, occupying online test resources, and long time-consuming positioning of continuous bad points, etc., to improve The effect of testing efficiency and improving positioning speed

Active Publication Date: 2017-04-05
SINO IC TECH
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Problems solved by technology

[0004] The purpose of the present invention is to provide a method for offline positioning of continuous dead pixels of image sensor chips to solve the problems of long time-consuming positioning of continuous dead pixels during online testing, occupation of online testing resources, and low testing efficiency

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  • Method for Offline Locating Continuous Dead Pixels of Image Sensor Chip
  • Method for Offline Locating Continuous Dead Pixels of Image Sensor Chip
  • Method for Offline Locating Continuous Dead Pixels of Image Sensor Chip

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Embodiment Construction

[0049] The specific implementation manner of the present invention will be described in more detail below with reference to schematic diagrams. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that all the drawings are in a very simplified form and use imprecise scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.

[0050] Such as figure 1 As shown, the present invention provides a method for off-line positioning image sensor chip continuous dead pixels, comprising the following steps:

[0051] S1: Obtain a frame of test image obtained by testing the image sensor chip under test, and store the test image on an offline terminal.

[0052] Specifically, when the image sensor chip under test is tested online, a frame of the test image of the image sensor chip under test is acquired through a test machine, and then the test ima...

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Abstract

The invention provides a method for offline positioning of continuous bad points of an image sensing chip. The method comprises the following steps of obtaining a one-frame test image of the image sensing chip to be tested and storing the one-frame test image on an offline terminal; converting the tested image into a first binary system image; obtaining the positions of line continuous bad points in the tested image and the number of corresponding bad points; obtaining column continuous bad points in the tested image and the number of corresponding bad points; obtaining the positions and number of the continuous bad points on the image sensing chip, wherein N is a natural number. After the one-frame test image is obtained through a test machine table, the tested image is stored on the offline terminal, the positions and number of the line continuous bad points and the positions and number of the column continuous bad points on the tested image are respectively obtained, accordingly the positions and number of all continuous bad points on the image sensing chip are obtained, the positioning speed of the continuous bad points on the tested image is improved, online test resources are not occupied, and test efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a method for off-line positioning of continuous dead pixels of an image sensing chip. Background technique [0002] With the rapid development of smart phones, digital cameras, tablet computers and other consumer electronics, medical imaging, automobiles, security monitoring, space science, machine vision and other fields, the market demand for image sensor chips is also growing exponentially. If the CPU is the heart of the system, then the image sensor chip is the eyes of the system. The dead pixels in the image sensor chip will seriously affect the use of the chip. At present, many image sensor chips can find out the dead pixels through testing, and correct the dead pixels according to different algorithms to obtain better image quality. However, if the dead pixels are continuous, it is difficult to correct them with simple algorithms. Usually, it is necess...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66
CPCH01L22/30H01L22/34
Inventor 余琨牛勇汤雪飞徐惠叶建明
Owner SINO IC TECH
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