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Determination method for complex refractive index of entomogenous fungus beauveria bassiana or green muscardine fungus

A technology of complex refractive index and entomogenous fungus, which is applied in the measurement of phase influence characteristics, etc.

Inactive Publication Date: 2015-05-13
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Researches on these two fungi have mainly focused on culture methods, genetic modification, and toxicological studies, and no one has studied the optical properties.

Method used

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  • Determination method for complex refractive index of entomogenous fungus beauveria bassiana or green muscardine fungus
  • Determination method for complex refractive index of entomogenous fungus beauveria bassiana or green muscardine fungus
  • Determination method for complex refractive index of entomogenous fungus beauveria bassiana or green muscardine fungus

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Embodiment 1

[0015] Embodiment one: the determination of the k value and the n value of Beauveria bassiana spores and hyphae.

[0016] The method for measuring the complex refractive index of entomogenous fungus Beauveria bassiana by specular reflection method consists of the following steps:

[0017] (1) Activation of strains: the Beauveria bassiana stored in glycerol tubes were transferred to a PDA slant, and cultured at 26° C. for 7 days.

[0018] (2) Cultivation of seeds: Scrape 3 rings of Beauveria bassiana from the slope, transfer to a 50mL PDB Erlenmeyer flask, cultivate at 26°C for 2 days, and use as seeds for solid culture.

[0019] (3) Solid fermentation culture: use rice with a liquid-solid ratio of 2:1 as the base medium, and add a certain amount of KNO 3 and MgSO 4 ·7H 2 O as an inorganic salt. Inoculate solid media at a 10% inoculum size. Cultured at 26°C for 7 days.

[0020] (4) Collection of spores and hyphae: drying the culture medium at 60° C. to constant weight. C...

Embodiment 2

[0028] Embodiment two: the determination of the k value and n value of Metarhizium anisopliae spores and hyphae.

[0029] The method for measuring the complex refractive index of the entomogenous fungus Metarhizium anisopliae by specular reflection method consists of the following steps:

[0030] (1) Activation of strains: Metarhizium anisopliae stored in glycerol tubes were transferred to PDA slant and cultured at 26°C for 13 days respectively.

[0031] (2) Cultivation of seeds: Scrape 3 rings of Metarhizium anisopliae from the slope, transfer to a 50 mL PDB Erlenmeyer flask, culture at 26° C. for 2 days, and use as seeds for solid culture.

[0032] (3) Solid fermentation culture: use rice with a liquid-solid ratio of 2:1 as the base medium, and add a certain amount of KNO 3 and MgSO 4 ·7H 2 O as an inorganic salt. Inoculate solid media at a 10% inoculum size. Cultured at 26°C for 13 days.

[0033] (4) Collection of spores and hyphae: drying the culture medium at 60° C....

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Abstract

The invention discloses a determination method for complex refractive index of entomogenous fungus beauveria bassiana or green muscardine fungus. A specular reflection method is adopted for determining complex refractive index of beauveria bassiana or green muscardine fungus: pure spores and hyphae of the beauveria bassiana or green muscardine fungus obtained by fermentation are subjected to freeze drying and then the pure spores and hyphae subjected to freeze drying are pressed into tablets, and spectrographic determination is carried out on the pure spores and hyphae of the beauveria bassiana or green muscardine fungus which are pressed into tablets by using a Fourier infrared spectrometer and taking a gilded reflection mirror as a background. Compared with the prior art, the determination method disclosed by the invention has the following advantages: special treatment does not need to be carried out on samples, so that physical conditions are not damaged, the related problems of scattered radiation of irregular particles inverted by Mie scattering theory are avoided, and the morphology and particle size of particles are not limited.

Description

technical field [0001] The invention relates to a method for measuring the complex refractive index of the entomogenic fungus Beauveria bassiana or Metarhizium anisopliae. Background technique [0002] Beauveria bassiana and Metarhizium anisopliae are a kind of entomogenic fungi of half-known fungi, which have vegetative organ hyphae and reproductive organ spores, and are currently mainly used in forest pest control. The studies on these two fungi mainly focus on the cultivation methods, genetic modification, and toxicological studies, but no one has studied the optical properties. In the present invention, we use the specular reflection method to study its optical properties with a micro-infrared spectrometer. The acquisition of optical properties of Beauveria bassiana and Metarhizium anisopliae spores and mycelia laid the foundation for the application of microorganisms in electromagnetic attenuation and opened up new application paths for microorganisms. [0003] The op...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/41
Inventor 郑之明刘红霞王鹏胡以华顾有林刘会赵根海王丽王晗
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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