Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Method for Extracting the Envelope Parameters of Grid Voltage Flicker

A grid voltage and parameter extraction technology, applied in the field of signal processing, can solve problems such as fence effect, difficulty in accurately extracting flicker parameters, spectrum leakage, etc.

Active Publication Date: 2017-06-30
HUNAN UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method still has the spectrum leakage and fence effect caused by the rectangular wave truncated signal under asynchronous sampling, and it is difficult to accurately extract the flicker parameters, especially the adjacent AM wave components

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Method for Extracting the Envelope Parameters of Grid Voltage Flicker
  • A Method for Extracting the Envelope Parameters of Grid Voltage Flicker
  • A Method for Extracting the Envelope Parameters of Grid Voltage Flicker

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0063] A test platform for a grid voltage flicker envelope parameter extraction method provided by an embodiment of the present invention is as follows: figure 1 As shown, the signal generator uses the Agilent 33500B of Agilent Corporation of the United States to generate the flicker signal u(n), and the PC uses Lenovo ThinkpadE40 notebook computer to connect the signal generator to control the parameters of the signal generation, and the data acquisition uses the National Instruments NI data acquisition card ELVIS II, the data obtained is acquired by the acquisition program of LabVIEW software of National Instruments, and the generated signal is monitored in real time by the oscilloscope Agilent DSO1102B of Agilent Company of the United States. Finally, the data collected by LabVIEW is imported into the DSP program and simulated by the CCS software of Texas Instruments. The DSP processor uses the TMS320C6745 of Texas Instruments.

[0064] The main parameters are selected as f...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for extracting power grid voltage flicker envelope parameters. According to the method, power grid voltage flicker waveforms are sampled at a constant sampling frequency, a flicker envelope amplitude modulated wave component is obtained through energy calculation of an improved Teager energy operator, a cosine window is added to conduct Chirp-Z conversion, the flicker envelope amplitude modulated wave frequency and a correction factor of an amplitude modulated wave amplitude value are extracted by improving the Chirp-Z conversion, and the flicker envelope amplitude modulated wave amplitude value is corrected through the correction factor and accurately obtained; through the combination of the improvement on the energy operator and the improvement on the Chirp-Z conversion, the energy operator is improved, the flicker envelope demodulation calculation process by the energy operator is improved, the noise resistance is improved; by improving the Chirp-Z conversion, the flicker frequency analysis range is flexible and adjustable, and frequency spectrum leakage generated under the condition of asynchronous sampling and errors caused by a picket fence effect are effectively avoided; the correction factor of the amplitude modulated wave amplitude value reduces the errors caused by the energy operator, and the power grid voltage flicker envelope parameters can be accurately measured in real time.

Description

technical field [0001] The invention belongs to the technical field of signal processing, in particular to a method for extracting network voltage flicker envelope parameters. Background technique [0002] The sharp increase of power load, especially the impact load, constitutes a serious pollution to the power system, resulting in unstable grid voltage, voltage fluctuations and flickering, increasing the instability of the grid, and causing serious damage to industrial production and social life. influences. Voltage flicker is an important parameter of power quality and an important cause of failure and failure of power supply and consumption equipment. Accurate measurement of voltage flicker in power supply and consumption systems can provide scientific basis for studying the source of flicker, suppressing and eliminating the impact of voltage fluctuation and flicker, etc. [0003] Accurate estimation of voltage flicker envelope parameters is the most critical factor for...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R19/00
Inventor 高云鹏李峰曹一家陈婧李林柯盼盼滕召胜黎灿兵
Owner HUNAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com