Multilayer ceramic capacitor

Abstract

The invention discloses a multilayer ceramic capacitor which comprises a ceramic body, a first external electrode and a second external electrode, wherein the first external electrode and the second external electrode are arranged at the two opposite ends of the ceramic body respectively. The ceramic body comprises a cuboid first part and a cuboid second part in the height direction. The first part comprises a plurality of first inner electrode layers and a plurality of second inner electrode layers, wherein the first inner electrode layers and the second inner electrode layers are alternately stacked. The second part comprises a plurality of third inner electrode layers and a plurality of fourth inner electrode layers, wherein the third inner electrode layers and the fourth inner electrode layers are alternately stacked. The content of nickel in the first part is larger than the content of nickel in the second part. When section detection is conducted on the multilayer ceramic capacitor or the ceramic body, samples to be detected can be carried through flat plates and are overturned through permanent magnets arranged below the flat plates, and due to the fact that the content of nickel in the first part is larger than the content of nickel in the second part of the ceramic body of the multilayer ceramic capacitor, the samples to be detected can be easily overturned to the uniform positioning orientation.

Description

technical field [0001] The invention relates to the field of electronic components, in particular to a multilayer ceramic capacitor. Background technique [0002] A conventional multilayer ceramic capacitor includes a cuboid ceramic body and two external electrodes disposed at opposite ends of the ceramic body. The ceramic body includes a plurality of internal electrode layers alternately stacked and respectively connected to external electrodes of different polarities and a plurality of dielectric layers respectively stacked between the internal electrode layers of different polarities, so that a multilayer ceramic capacitor can obtain a higher High capacity value. With the development of multilayer ceramic capacitors to high capacity, the number of stacked layers of dielectric layers and internal electrode layers increases, so that the height of multilayer ceramic capacitors increases and is equal to or close to its width. Therefore, if the cross-section inspection of mu...

AI Technical Summary

Problems solved by technology

Therefore, if the cross-section inspection of multilayer ceramic capacitors or ceramic bodies with similar width and thickness dimensions is to be carried out, when the chips to be inspected are arranged in the mold, there is a possibility that the chips may be misaligned, that is, as many as half of the chips may be due to orientation orientation. Failure to obtain the desired grinding surface, i.e. viewing surface, by mistake, resulting in reduced inspection efficiency and operational difficulties

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