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Test system for ADC chip characteristic parameter test precision

A technology for testing accuracy and characteristic parameters, applied in the direction of analog/digital conversion calibration/testing, etc., it can solve the problems of complex operation, the performance index of ADC chip cannot meet the accuracy requirements, and the flexibility of logic analyzer is poor, and achieve accurate characteristic test results. , Improve the output driving ability and ensure the effect of accuracy

Inactive Publication Date: 2015-06-24
SINO IC TECH
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  • Abstract
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AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to provide a test system for testing the accuracy of ADC chip characteristic parameters, to solve the problem of poor flexibility and complex operation of the logic analyzer, and the performance index of the sacrificed ADC chip cannot meet the accuracy requirements.

Method used

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  • Test system for ADC chip characteristic parameter test precision
  • Test system for ADC chip characteristic parameter test precision
  • Test system for ADC chip characteristic parameter test precision

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Embodiment Construction

[0027] The specific embodiments of the present invention will be described in more detail below in conjunction with the schematic diagram. According to the following description and claims, the advantages and features of the present invention will be clearer. It should be noted that the drawings are in a very simplified form and all use imprecise proportions, which are only used to conveniently and clearly assist in explaining the purpose of the embodiments of the present invention.

[0028] Such as Image 6 As shown, the present invention provides a test system for testing accuracy of ADC chip characteristic parameters, including: ATE test equipment 201 connected to the input and output ends of the ADC chip 202 under test, and the output of the ADC chip 202 under test A buffer 203 is connected between the terminal and the ATE test equipment 201. The buffer 203 is a high-speed and low-capacitive input buffer that meets the bandwidth requirements of the ADC chip 202 output signal...

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Abstract

The invention provides a test system for ADC chip characteristic parameter test precision. The test system comprises (test equipment) ATE connected with the input end and the output end of a tested ADC chip, a buffer is connected with the output end of the tested ADC chip, and the output end of the buffer is connected with the ATE. As the buffer is connected between the output end of the tested ADC chip and the ATE, the output drive capacity of the ADC chip is improved, the time sequence of output signals and the accuracy of an electrical level of the ADC chip are ensured, and therefore a more accurate ADC chip characteristic test result can be obtained.

Description

Technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a testing system for testing accuracy of ADC chip characteristic parameters. Background technique [0002] The ADC chip (Analog-to-Digital Converter) needs to pass ATE (Automatic Test Equipment) to test its performance parameters. Such as figure 1 As shown, the DC power supply 103 on the ATE 101 is connected to the ADC chip 102 to provide a reference power supply for the ADC chip 102, and the ATE 101 provides an analog input signal V1' and a clock signal for the ADC chip 102 V2', the analog input signal is converted into a digital signal V3' after passing through the ADC chip 102, and the digital signal is output to a digital processor 104 on the ATE101. [0003] In the actual high-speed sampling process of the ADC chip, in order to ensure the synchronization of the internal sampling clock of the ADC chip and the sampling signal of the ATE digital terminal, ensure th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
Inventor 邓维维王华牛勇徐惠郝丹丹王静
Owner SINO IC TECH
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