Test system and test method

Abstract

The invention discloses a test system and a test method. The test system is used for testing a display panel, and the display panel is provided with a signal input terminal which is arranged in a non-display area of the display panel and is directly connected with a signal transmission line of a display area. The test system comprises a signal generating unit, a control unit and an output unit, wherein the signal generating unit has a first mode and a second mode, a test signal which is used for testing a panel level voltage-transmittance curve of the display panel is generated in the first mode, and a test signal which is used for testing a module level voltage-transmittance curve of the display panel is generated in the second mode; the control unit is used for controlling the working mode of the signal generating unit according to current test requirements; the output unit is used for outputting the test signals generated by the signal generating unit to the signal input terminal, so as to drive at least a part of the display panel to display. According to the test system and the test method, the panel level test and the module level test of the VT curves are realized at the same stage, and the test efficiency is improved.

Description

technical field [0001] The invention relates to testing technology, in particular to a testing system and testing method for testing the VT curve of a liquid crystal display device. Background technique [0002] The voltage-transmittance curve (V-T curve) of the display panel refers to the voltage-transmittance curve of the display panel itself in the stage of the display module without a driving circuit, which is an important data support in the product development stage. [0003] For the traditional liquid crystal display panel, the test of its voltage-transmittance curve is carried out in the following way: [0004] First, apply conductive glue on the input ends of the grid lines and data lines; [0005] Secondly, lead out wires from the input ends of the gate lines and data lines by the signal generator, and connect them with the conductive glue; [0006] Thirdly, the signal generator inputs a high-voltage signal at the input terminal of the gate line, so that the thin...

AI Technical Summary

Problems solved by technology

[0011] However, in the prior art, the module-level test is performed after the chip is packaged. At this time, the test needs to remove the connection between the data-driven chip and the panel to load the data-driven test signal to the data line.

And this will obviously cause a certain degree of damage to the display panel, and the display panel after the test needs to re-establish the electrical connection between the chip and the panel, which increases the process and wastes time.

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