Circuit for measuring width of single-particle transient pulse

A single-event pulse and single-event transient technology, applied in pulse characteristic measurement and other directions

Active Publication Date: 2015-07-29
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The single event pulse receiving end is connected to the 010 type single event pulse signal to be tested

Method used

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  • Circuit for measuring width of single-particle transient pulse
  • Circuit for measuring width of single-particle transient pulse
  • Circuit for measuring width of single-particle transient pulse

Examples

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Embodiment Construction

[0026] figure 1 Shown is a schematic structural diagram of a single event transient pulse width measurement circuit provided by an embodiment of the present invention, including a control signal generation circuit 101 and at least one stage of delay comparison circuit 102 . figure 1 It is shown that the delay comparison circuit 102 has n stages (for example, it may be composed of 8 stages). In the following, when measuring the single event pulse signal with a specific width range, an 8-stage delay comparison circuit is used, of course, according to the measurement requirements, it is not limited thereto.

[0027] According to an embodiment of the present invention, the control signal generating circuit (101) has a reset signal input terminal, a single event pulse receiving terminal, a pulse start signal output terminal (out1) and a pulse end signal output terminal (end). The single event pulse receiving end is connected to the 010 type single event pulse signal (input) to be ...

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Abstract

The invention discloses a circuit for measuring width of a single-particle transient pulse. The circuit includes a control signal generation circuit and at least one grade of dual-delay comparison circuit, wherein the control signal generation circuit is provided with a reset input end, a single-particle pulse receiving end, a pulse start output end and a pulse end output end; each grade of dual-delay comparison circuit is provided with a reset input end, a first delay input end, a second delay input end, a first delay output end, a second delay output end and a comparison output end. The first delay input end in the first grade is connected with the pulse start output end while the second delay input end is connected with the pulse end output end, and from the second grade, the first delay input end in each grade is connected with the first delay output end of the previous grade while the second delay input end is connected with the second delay output end of the previous grade. The measuring circuit realized according to the invention can measure the high level pulse width of single-particle transient pulse, and is wide in measurement range and high in measurement accuracy.

Description

technical field [0001] The invention relates to the technical field of electric pulse width measurement, in particular to a high-level pulse width measurement circuit of a single-event transient pulse signal. Background technique [0002] With the continuous improvement of the integration of aerospace electronic devices, space radiation has become an important factor affecting the reliability and operating life of spacecraft. The effects of radiation on integrated circuits fall into two main categories: single event effects and total dose effects. The total dose effect is the effect produced by the accumulation of radiation effects after the integrated circuit has been in the radiation environment for a long time; the single event effect is the effect produced by the immediate radiation effect after the radiation energy particles enter the integrated circuit. Single event effects can be subdivided into three categories: [0003] 1. Single event soft error effect: including...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/02
Inventor 宿晓慧罗家俊韩郑生刘海南郝乐李欣欣
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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