Capacitance mismatch calibrating circuit and calibrating method applied to single-end SAR ADC

A capacitance mismatch and calibration circuit technology, which is applied in the field of SAR ADC calibration, can solve the problems of establishment time limit, power consumption increase, chip cost increase, etc., and achieve the effects of saving power consumption and area, calibrating dynamic errors, and being easy to implement

Active Publication Date: 2015-09-16
SOUTHEAST UNIV
View PDF7 Cites 22 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, with large DAC (digital-to-analog converter) capacitors, settling time is limited and power consumption increases
In addition, the traditional calibration method requires a separate calibration DAC array for each capacitor that needs to be calibrated. Although the calibration DAC array only needs about 5 bits, once there are many capacitors that need to be calibrated, the capacitance of the calibration DAC array may be different from that of the DAC itself. The area o

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Capacitance mismatch calibrating circuit and calibrating method applied to single-end SAR ADC
  • Capacitance mismatch calibrating circuit and calibrating method applied to single-end SAR ADC
  • Capacitance mismatch calibrating circuit and calibrating method applied to single-end SAR ADC

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0044] The present invention will be further explained below in conjunction with the drawings.

[0045] The present invention proposes to calibrate the capacitor array based on a single-ended 14bit binary redundancy, and calibrate the capacitor array to improve the accuracy of the ADC. Because the present invention is based on redundant capacitance calibration. Therefore, the redundant capacitance calibration of the single-ended SAR ADC is explained first.

[0046] figure 1 Redundant calibration operation process for single-ended SAR ADC. It can be seen from the figure that the operation process of its non-redundant bits is exactly the same as that of a normal single-ended SAR ADC. And when switched to redundant bit C jr+ And C jr- , First check the C before the redundant bit j Make a judgment, if bj is 1, then enter the branch of positive compensation, namely Cjr+; if bj is 0, enter the branch of negative compensation, namely Cjr-. When entering the positive compensation branc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a capacitance mismatch calibrating circuit and calibrating method applied to a single-end SAR ADC (Successive Approximation Analog-to-Digital Converter). By using the method, error caused by capacitance mismatch of the SAR ADC can be calibrated. According to the method, only two pairs of redundant capacitance need to be inserted in an analog domain for compensation of capacitance mismatch in a digital domain. A binary capacitance DAC (Digital-to-Analog Converter) containing two pairs of redundant dot capacitance includes a segmentation binary capacitance DAC and redundant capacitance Cjr+, Cjr- inserted to the lowest bit of aN MSB segment of a segmentation capacitance, and redundant capacitance Cqr+, Cqr- inserted to an LSB segment. A redundant bit calculation module adds the inserted redundant bits to other normal bits and obtains N-bit valid output. A capacitance mismatch calibrating module performs compensation to capacitance mismatch on the output result. Compared with the traditional SAR ADC structure, only two pairs of redundant capacitance are added. The calculation of mismatch compensation is performed in the digital domain, so that the layout size and analog circuit complexity is reduced.

Description

technical field [0001] The invention relates to a mismatch calibration method applied to a single-end SAR ADC capacitance, which belongs to the SAR ADC calibration technology. Background technique [0002] High-precision SAR ADC (Successive Approximation Register-type Analog-to-Digital Converter) needs to use larger capacitors to meet the requirements of capacitor matching due to the limitation of its capacitor mismatch, especially when the accuracy is higher than 12-bit. Capacitor mismatch calibration is required to address the effects of capacitor mismatch. However, with large DAC (digital-to-analog converter) capacitors, settling time is thus limited and power consumption increases. In addition, the traditional calibration method requires a separate calibration DAC array for each capacitor that needs to be calibrated. Although the calibration DAC array only needs about 5 bits, once there are many capacitors that need to be calibrated, the capacitance of the calibration D...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H03M1/10H03M1/38
Inventor 吴建辉林志伦孙杰黄成李红张萌
Owner SOUTHEAST UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products