Testing device adopting high-voltage medium-frequency power supply low-voltage circuit and dummy load

A low-voltage circuit and intermediate frequency power supply technology, applied in the field of dummy load test equipment, can solve problems such as limited test conditions, and achieve the effect of simple device structure

Inactive Publication Date: 2015-09-30
江苏容天机电科技有限公司
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, in the actual test process, due to the large number of dummy loads, sometimes multiple switching is required, thus limiting the test conditions

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing device adopting high-voltage medium-frequency power supply low-voltage circuit and dummy load

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0010] The present invention will be further described below in conjunction with the accompanying drawings.

[0011] Depend on figure 1 It can be seen that a high-voltage intermediate-frequency power supply low-voltage circuit dummy load testing device includes a touch screen 1, a high-voltage intermediate-frequency power supply low-voltage circuit 2, a dummy load 3, and an oscilloscope 4. The high-voltage intermediate-frequency power supply low-voltage circuit 2 communicates with the touch screen 1 through a serial port. 1 is used as a man-machine interface to control the low-voltage circuit 2 of the high-voltage intermediate-frequency power supply, wherein the low-voltage circuit 2 of the high-voltage intermediate-frequency power supply includes a control circuit board, a transformer and a low-voltage power circuit. The dummy load 3 is connected to the high-voltage intermediate-frequency low-voltage circuit 2, and as an analog load, it is composed of a series of resistors co...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a testing device adopting a high-voltage medium-frequency power supply low-voltage circuit and a dummy load. The testing device comprises a touch screen, the high-voltage medium-frequency power supply low-voltage circuit, the dummy load and an oscilloscope, wherein the high-voltage medium-frequency power supply low-voltage circuit and the touch screen perform communication through a serial port; the touch screen serving as a human-computer interface is used for controlling the high-voltage medium-frequency power supply low-voltage circuit; the high-voltage medium-frequency power supply low-voltage circuit comprises a control circuit board, a mutual inductor and a low-voltage power circuit. The testing device is simple in structure, can effectively detect the work state of the high-voltage medium-frequency power supply low-voltage circuit to ensure normal work of the high-voltage medium-frequency power supply low-voltage circuit and lays a good foundation for following access of a high-voltage rectifier transformer for complete computer testing.

Description

technical field [0001] The invention relates to a dummy load testing device, in particular to a dummy load testing device for a low-voltage circuit of a high-voltage intermediate frequency power supply. Background technique [0002] At present, in order to ensure the quality and performance of data center computer room delivery, many newly built computer rooms use dummy loads to simulate real server load heating and power consumption to test the availability of the entire computer room system. This process is called computer room comprehensive testing. The available data center computer rooms basically adopt the dual bus mode of dual power supply. Under normal operating conditions, the dual power supplies in the data center computer room each bear 50% of the load in the computer room. Currently, the dummy load used for the comprehensive test of the computer room Both adopt single-channel power supply mode, so when testing dual-channel power supplies, only one power supply ca...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/28
Inventor 王威陈峰
Owner 江苏容天机电科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap