Semiconductor device and method of forming the same
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[0033] As mentioned in the background technology, with the development of miniaturization, the critical size of the non-volatile memory is getting smaller and smaller, which causes the read and write current required by the non-volatile memory to be larger and larger. After analysis, the above problems The reason is that the contact resistance of the control grid is getting bigger and bigger. Based on the above analysis, the present invention proposes to expose the top of the gate structure of the memory cell area and the peripheral circuit area and the Part of the sidewall, and through the exposed top and sidewall, form a gate structure containing metal silicide, thereby simultaneously reducing the contact resistance of the non-volatile memory control gate in the memory cell area and the transistor gate in the peripheral circuit area. The contact resistance of the electrode is reduced, thereby reducing the read and write current of the non-volatile memory and the read and wri...
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