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Backlight image micron-order edge detection method

An edge detection, micron-level technology, applied in image analysis, image data processing, instruments, etc.

Active Publication Date: 2015-10-28
SHENYANG POLYTECHNIC UNIV
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  • Abstract
  • Description
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AI Technical Summary

Problems solved by technology

These methods work well for front-illuminated images, none of which are suitable for micron-scale edge detection on back-lit images

Method used

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  • Backlight image micron-order edge detection method
  • Backlight image micron-order edge detection method
  • Backlight image micron-order edge detection method

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Experimental program
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Embodiment Construction

[0056] As shown in the figure, the present invention comprises the following steps:

[0057] 1. Combining the point spread function and the unilateral step model, construct the normal distribution function model of the backlight image step edge normal plane section line.

[0058] The foreground and background of the backlight edge detection image are constant P 1 ,P 2 , as attached figure 1 As shown, the gray level difference between background and foreground is

[0059] g=P 2 -P 1

[0060] The intercept line of the gray surface through the edge normal plane is a normal distribution function (Gaussian integral) curve:

[0061] p = g 2 π σ ∫ - ∞ R e - 1 2 ...

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Abstract

The invention belongs to the technical field of high-precision detection and especially relates to a backlight image micron-order edge detection method with high curved surface fitting precision and a good anti-interference effect. The method comprises the following steps of: 1) in combination with a point spread function and a unilateral step model, constructing a backlight image step edge normal plane transversal normal distribution function model, wherein the foreground and the background of a backlight edge detection image are constants P1 and P2, the gray difference of the foreground and the background is g=P2-P1, a transversal of the gray curved surface passing through the edge normal plane is a normal distribution function (gauss integration) curve is described in the specifications, then a formula described in the specifications is satisfied, and the projection of image edge points passing the central point of the curve in an image place is described in the specifications or satisfies t- [mu]=0.

Description

technical field [0001] The invention belongs to the technical field of high-precision detection, and in particular relates to a micron-level edge detection method of a backlight image. Background technique [0002] The machine vision measurement system integrates multi-field and multi-disciplinary key technologies such as optics, sensors, image processing and pattern recognition, and is widely used in the field of non-contact high-speed online measurement. The invention utilizes machine vision and digital image processing technology to establish a normal normal probability distribution curve image edge grayscale surface model for backlit digital images, uses the least square method to obtain four coefficients of the fitting surface, and obtains micron-level sub-pixel edges . [0003] Patent application number: 2011104481191, titled "A Color Image Edge Detection Method", which decomposes a color image into four channel images of red, green, blue and yellow, calculates the re...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
Inventor 赵文辉赵文珍段振云王宁
Owner SHENYANG POLYTECHNIC UNIV
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