Micron-scale edge detection method for backlit images
An edge detection, micron-level technology, applied in image analysis, image data processing, instruments, etc., to achieve fast solution speed, improve accuracy, and reduce computational complexity
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[0056] As shown in the figure, the present invention comprises the following steps:
[0057] 1. Combining the point spread function and the unilateral step model, construct the normal distribution function model of the backlight image step edge normal plane section line.
[0058] The foreground and background of the backlight edge detection image are constant P 1 ,P 2 , as attached figure 1 As shown, the gray level difference between background and foreground is
[0059] g=P 2 -P 1
[0060] The intercept line of the gray surface through the edge normal plane is a normal distribution function (Gaussian integral) curve:
[0061]
[0062] but
[0063]
[0064] The projection of the image edge point through the center point of the curve on the image plane, ( or t-μ=0)
[0065] 2. Surface fitting solution of discrete points in the transition zone
[0066] In order to simplify the surface model, make μ, σ linearly change in the small neighborhood along the edge line...
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