A 3D Surface Shape Measurement Method Based on Moving Least Squares Method

A least-squares, three-dimensional surface technology, applied in measurement devices, instruments, optical devices, etc., can solve the problems of low accuracy, weak phase demodulation ability in local shadow areas, poor measurement smoothness, etc., to achieve surface fitting High precision, good smoothness, and the effect of improving reconstruction accuracy

Active Publication Date: 2020-05-01
HUAIYIN TEACHERS COLLEGE
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is that the existing three-dimensional surface shape measurement method has the problems of weak phase demodulation ability for local shadow areas, poor measurement smoothness and low accuracy

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  • A 3D Surface Shape Measurement Method Based on Moving Least Squares Method
  • A 3D Surface Shape Measurement Method Based on Moving Least Squares Method
  • A 3D Surface Shape Measurement Method Based on Moving Least Squares Method

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Embodiment Construction

[0037] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0038] The invention provides a three-dimensional surface shape measurement method based on the moving least squares method. The measurement device used in the measurement system is as figure 1 As shown, the optical axis PO of the projection system intersects the optical axis IO of the imaging system at point O on the reference plane. d is the distance between the exit pupil P of the projector and the entrance pupil I of the camera, and L is the distance from the exit pupil of the camera to the reference plane. The projection system projects the sinusoidal fringe image onto the reference surface to obtain the reference fringe image. The distribution of the reference fringe can be expressed as:

[0039] I r (x,y)=A(x,y)+B(x,y)cos(2πf 0 x) (1)

[0040] In the formula, A(x, y) is the background intensity, B(x, y) is the modulation intensity....

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Abstract

The invention discloses a moving least square method-based three-dimensional surface-shaped measurement method. The moving least square method-based three-dimensional surface-shaped measurement methodcomprises the following steps of building a target function by a moving lead square method, normalizing an expression of a deformation strip, performing regularization on the deformation strip, extracting a phase by Hibert conversion, and solving deformation information of a detected object so as to obtain three-dimensional surface distribution of the detected object. According to the moving least square method-based three-dimensional surface-shaped measurement method, the target function of a deformation strip pattern is obtained by combining the moving least square method, the regularization is performed on the deformation strip, the phase information of the detected object is solved by combining the characteristic that Hibert conversion has 90-degree phase shift, the moving least square method-based three-dimensional surface-shaped measurement method has the advantages of high surface fitting accuracy and good smoothness, the proposed method does not need filtering operation, a zero-frequency component in the strip pattern is eliminated, a phase of the detected object also can be demodulated from a local projection region by a Hibert conversion method, a depth relevant phase isdemodulated from the deformation strip pattern, and the reconstruction accuracy of three-dimensional surface shape is improved.

Description

technical field [0001] The invention relates to the field of three-dimensional surface shape measurement, in particular to a three-dimensional surface shape measurement method based on a moving least square method. Background technique [0002] The fringe projection three-dimensional measurement has the advantages of non-contact, high measurement accuracy, and fast measurement speed. It has broad application prospects in the fields of machine vision, virtual reality, biomedicine, and reverse engineering. Fourier transform profilometry has the characteristics of single-frame acquisition, full-field analysis, fast speed and high degree of automation, and has been widely used. However, when using Fourier transform profilometry to restore the object's surface shape, it is necessary to extract the fundamental frequency component through filtering operations, which reduces the noise and also loses the high-frequency information reflecting the details of the object, and reduces the...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 边心田左芬程菊雷枫
Owner HUAIYIN TEACHERS COLLEGE
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