A 3D Surface Shape Measurement Method Based on Moving Least Squares Method
A least-squares, three-dimensional surface technology, applied in measurement devices, instruments, optical devices, etc., can solve the problems of low accuracy, weak phase demodulation ability in local shadow areas, poor measurement smoothness, etc., to achieve surface fitting High precision, good smoothness, and the effect of improving reconstruction accuracy
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[0037] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0038] The invention provides a three-dimensional surface shape measurement method based on the moving least squares method. The measurement device used in the measurement system is as figure 1 As shown, the optical axis PO of the projection system intersects the optical axis IO of the imaging system at point O on the reference plane. d is the distance between the exit pupil P of the projector and the entrance pupil I of the camera, and L is the distance from the exit pupil of the camera to the reference plane. The projection system projects the sinusoidal fringe image onto the reference surface to obtain the reference fringe image. The distribution of the reference fringe can be expressed as:
[0039] I r (x,y)=A(x,y)+B(x,y)cos(2πf 0 x) (1)
[0040] In the formula, A(x, y) is the background intensity, B(x, y) is the modulation intensity....
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