Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

56results about How to "Good smoothness" patented technology

Moving least square method-based three-dimensional surface-shaped measurement method

ActiveCN109186496AHigh accuracy of surface fittingGood smoothnessUsing optical meansPhase shiftedComputer vision
The invention discloses a moving least square method-based three-dimensional surface-shaped measurement method. The moving least square method-based three-dimensional surface-shaped measurement methodcomprises the following steps of building a target function by a moving lead square method, normalizing an expression of a deformation strip, performing regularization on the deformation strip, extracting a phase by Hibert conversion, and solving deformation information of a detected object so as to obtain three-dimensional surface distribution of the detected object. According to the moving least square method-based three-dimensional surface-shaped measurement method, the target function of a deformation strip pattern is obtained by combining the moving least square method, the regularization is performed on the deformation strip, the phase information of the detected object is solved by combining the characteristic that Hibert conversion has 90-degree phase shift, the moving least square method-based three-dimensional surface-shaped measurement method has the advantages of high surface fitting accuracy and good smoothness, the proposed method does not need filtering operation, a zero-frequency component in the strip pattern is eliminated, a phase of the detected object also can be demodulated from a local projection region by a Hibert conversion method, a depth relevant phase isdemodulated from the deformation strip pattern, and the reconstruction accuracy of three-dimensional surface shape is improved.
Owner:HUAIYIN TEACHERS COLLEGE

Controlling method for wrapping surface of tire

The invention provides a controlling method for wrapping the surface of a tire, comprising the following steps: an industrial personal computer (IPC) analog simulates the deformation of rubber pieces in the process of spire piling and the arrangement distribution situation of the each rubber piece in the surface of the tire to obtain spire pitches among each rubber piece; the IPC computes the virtual circle central coordinate and the radius of a wrapper at each loop of the arc of the surface of the tire, and sends a date to a PLC; the IPC respectively computes the arc of the each loop of the arc section of the surface of the tire, the horizontal coordinate of the each loop of the linear section of the surface of the tire and a corresponding theoretical velocity, to form a data table to be sent to the PLC; the PLC computes the real velocity of the wrapper according to the received data table; and the PLC computes to obtain a track coordinate data of the wrapper corresponding at the each loop and finally controls the wrapper to wrap the surface of the tire. The method realizes analog simulation in the process of wrapping the surface of the tire, adjusts the walk track and the walk velocity of the head of the wrapper immediately, and greatly improves the wrapping quality of the surface of the tire.
Owner:柳州市华工百川橡塑科技有限公司

Direct sliding type potentiometer

The invention discloses a direct sliding type potentiometer. The direct sliding type potentiometer comprises a shell, a sliding shaft moving in the shell and an outgoing bus installed on the shell, wherein the shell is internally provided with a resistor body assembly; the resistor body assembly comprises an insulation plate provided with a conductor rail and three mounting lines mounted on the insulation plate, and the three mounting lines are converged at the outgoing bus position; one end of the sliding shaft stretches into the interior of the shell, and one end, stretching into the interior of the shell, of the sliding shaft is provided with an electric brush assembly; the electric brush assembly comprises a sliding block fixed on the sliding shaft; a reed is fixed on the sliding block; the reed is connected with the electric brush; and the electric brush is contacted with the conductor rail on the insulation plate. According to the invention, the effective conversion of linear displacement and an electronic signal can be achieved through the direct sliding type potentiometer; and the direct sliding type potentiometer has the advantages of high linearity, long rotating service life, good smoothness and high reliability, and is convenient for use and popularization.
Owner:SHAANXI HONGXING ELECTRONICS COMPONENTS

Signal singularity detection method based on sixth-order spline interpolation wavelet

The invention relates to a signal singularity detection method based on a sixth-order spline interpolation wavelet, which solves the problems of large calculation amount and low detection accuracy ofthe traditional method. The sixth-order spline interpolation wavelet scale function described in the description is obtained from the sixth-order spline wavelet scale function described in the description. The function described in the description yields the low pass filter Ps(omega), a high-pass filter Qs (omega) is obtained from the low-pass filter Ps (omega), a low-pass, high-pass filter Ps (omega), Qs (omega) obtains dual interpolation filters Gs (omega) and Hs (omega), the dual interpolation filter Gs (omega) is obtained, the coefficients of Fourier series of Hs (omega), input the signalto be tested and sample, The interpolation wavelet decomposition coefficients are obtained from the coefficients of the sampling value sequence and the dual interpolation filter Fourier series, The interpolation wavelet decomposition coefficients {an} and {bn} are normalized, and the obtained interpolation wavelet decomposition coefficients are processed by zero interpolation and threshold. The position of the maximum modulus point of the obtained interpolation wavelet decomposition coefficients is the position of the singularity point of the measured signal.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Magnetic field detection circuit, magnetic nail detection device and magnetic nail positioning method

The invention discloses a magnetic field detection circuit, a magnetic nail detection device and a magnetic nail positioning method. The magnetic field detection circuit comprises a Wheatstone bridge, a differential amplification circuit, a low-pass filter circuit and a rectification detection circuit, wherein the Wheatstone bridge is formed by putting up four metal film magneto-resistors; the magnetic nail detection device comprises s magnetic detection modules packaging the identical magnetic field detection circuits. According to the magnetic field detection circuit and the magnetic nail detection device, a differential voltage signal changed with an external magnetic field can be output via the Wheatstone bridge by virtue of an aeolotropy magnetoresistive effect of the metal film magneto-resistors; the voltage signal is then subjected to amplification, low-pass filtration and rectification detection; the signal acquisition precision is improved; a high frequency noise is removed by the filtration; the signal is output more smoothly; the magnetic nail positioning method achieves precise detection of lateral offset of a magnetic nail relative to the center of the magnetic nail detection device and further contributes to improvement of the navigation precision of the magnetic nail.
Owner:JIANGSU NEWAMSTAR PACKAGING MACHINERY

Image magnification method and device

The invention discloses an image magnification method and device. The method comprises the steps of calculating the positions, corresponding to first interpolating points in an original image, of pixel points to be interpolated in a new image according to a first pantograph ratio; calculating the positions of all second interpolating points in a region surrounded by m*m original pixel points in an adjacent region of the first interpolating points according to a second pantograph ratio, and enabling the positions, relative to the original pixels at the nearest upper left corner, of the second interpolating points to generate offset smaller than one pixel in the at least one direction of the horizontal or perpendicular directions, wherein the second pantograph ratio is two; calculating the pixel values of the second interpolating points according to n*n original pixel points in the adjacent region of the second interpolating points; calculating the offset amount, relative to the second interpolating points at the nearest upper left corner, of the first interpolating points according to a third pantograph ratio, and calculating the pixel values of the pixel points to be interpolated according to the offset amount and the pixel values of the a*a second interpolating points in the adjacent region of the first interpolating points, wherein the third pantograph ratio is equal to the result that the first pantograph ratio is divided by the second pantograph ratio.
Owner:HUAWEI TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products