Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Double Heterojunction Pin Electro-optic Modulator Structure

An electro-optical modulator and double heterojunction technology, which is applied in the fields of instruments, optics, nonlinear optics, etc., can solve the problem of increasing the modulation power consumption of devices, and achieve the goal of reducing optical transmission loss, facilitating optoelectronic integration, and reducing modulation power consumption. Effect

Inactive Publication Date: 2018-12-07
XI'AN POLYTECHNIC UNIVERSITY
View PDF1 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] There are three main structures of existing silicon-based electro-optic modulators: PIN structure, PN structure and MOS capacitor structure; among them, the PIN structure has the characteristics of simple structure, high modulation efficiency, and easy process realization, so the silicon-based electro-optic modulator with this structure However, the PIN structure is a working method of DC injection, which increases the modulation power consumption of the device while modulating. How to reduce the modulation power consumption of the device has always been a silicon-based electro-optic modulator based on the PIN electrical modulation structure. issues that need resolving

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Double Heterojunction Pin Electro-optic Modulator Structure
  • A Double Heterojunction Pin Electro-optic Modulator Structure
  • A Double Heterojunction Pin Electro-optic Modulator Structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0024] The present invention is a double heterojunction PIN electro-optic modulator structure, such as figure 1 As shown, an N-Sub type substrate 8 is included, and the upper part of the N-Sub type substrate 8 is provided with SiO 2 Buried Layer 7, SiO 2 A P+ well region 1 and an N+ well region 3 are respectively provided on both sides of the upper part of the buried layer 7, an intrinsic N-type silicon germanium modulation region 2 is provided between the P+ well region 1 and the N+ well region 3, and the upper part of the P+ well region 1 is provided There is a first electrode 4, the upper part of the N+ well region 3 is provided with a second electrode 5, and the upper part of the first electrode 4, the intrinsic N-type germanium-silicon modulation region 2 and the second electrode 5 is covered with SiO 2 cover layer 6.

[0025] The struc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
heightaaaaaaaaaa
widthaaaaaaaaaa
widthaaaaaaaaaa
Login to View More

Abstract

The invention discloses a double-heterojunction PIN electro-optical modulator structure. The structure comprises an N-Sub-type substrate. A SiO2 buried layer is arranged at the upper portion of the N-Sub-type substrate. A P+ trap region and an N+ trap region are arranged on the two sides of the upper portion of the SiO2 buried layer respectively, and an intrinsic N-type germanium-silicon modulation region is arranged between the P+ trap region and the N+ trap region. A first electrode is arranged at the upper portion of the P+ trap region, a second electrode is arranged at the upper portion of the N+ trap region, and the upper portion of the first electrode, the upper portion of the intrinsic N-type germanium-silicon modulation region and the upper portion of the second electrode are covered with a SiO2 covering layer. The double-heterojunction PIN electro-optical modulator structure is a PIN electro-optical modulator high in carrier injection and low in modulating power consumption, and can replace a conventional silicon-substrate PIN electro-optical modulator structure; the smaller modulating power consumption can be obtained during electro-optical modulating, the photoelectric conversion efficiency is improved, the proportion of electricity elements in photoelectric integration is decreased, and convenience is brought to smaller-size development of photoelectric integration.

Description

technical field [0001] The invention belongs to the technical field of optoelectronic devices, in particular to a structure of a double heterojunction PIN electro-optic modulator. Background technique [0002] Silicon-based electro-optic modulator is a micro-nano modulator that uses electro-optic effect, thermo-optic effect, plasma dispersion effect and other methods to change the refractive index of optical waveguide. For existing optoelectronic devices, their cross-sectional dimensions are in the order of micrometers, and their lengths are several centimeters; due to their large size, they cannot meet the requirements of large-scale photonic integration. [0003] With the advancement of optoelectronic technology, silicon-based modulators have entered the micro-nano size. Silicon-based electro-optical modulators can transmit single-mode light waves, have the advantages of high speed, low loss and small size, and are compatible with integrated circuit manufacturing processes...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/015
CPCG02F1/015G02F1/0151
Inventor 冯松薛斌李连碧张国青宋立勋翟学军朱长军
Owner XI'AN POLYTECHNIC UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products