Pulse monitoring device for durability of automobile ignition coil and realizing method of pulse monitoring device

Abstract

The invention relates to a pulse monitoring device for durability of an automobile ignition coil and a realizing method of the pulse monitoring device. A photoelectric isolating circuit, an RS232 communication module, a key processing interface, a data submitting main station interface, a fault brake operation interface and a display screen interface are all connected with a central processing unit MCU. An external pulse signal enters the central processing unit MCU through the photoelectric isolating circuit, counting and edge processing are carried out on an input pulse signal by the MCU, so as to complete pulse collection, pulse width, frequency and accumulation monitoring are carried out on the collected pulses, occurrence time and deadline of overfrequency and over-width faults, namely frequency and pulse width exceed preset frequency and pulse width parameters are recorded, external data storage is carried out, so that data analysis in the future is convenient, and a system main station can collect data at any time for comprehensive fault analysis. The pulse monitoring device has the benefits as follows: judgment, storage and failure isolation of signal pulses are realized, safety and effective verification of test equipment products are ensured, the operation s simple and convenient, and timeliness is high.

Description

technical field [0001] The invention relates to a pulse monitoring device and a realization method thereof, in particular to a pulse monitoring device and a realization method thereof for an automobile ignition coil durable stand. Background technique [0002] At present, many electronic products use a pulse generator as a signal input for testing or durability testing of products during testing or routine testing. For example: automotive ignition coil products. When the product is in the process of R & D and durability aging verification, it is generally carried out at 120°C, 500 hours, 50 times per second, that is, 50Hz high temperature, long-term, high-frequency product charging durability aging. During the durability verification, the pulse generating device may generate a fault pulse signal or even a normal high level due to interference and other conditions. These conditions are unpredictable during the test. The generation of fault pulses is likely to cause fatal da...

AI Technical Summary

Problems solved by technology

During the durability verification, the pulse generating device may generate a fault pulse signal or even a normal high level due to interference and other conditions. These conditions are unpredictable during the test

However, the fault pulse generation is likely to cause fatal damage to the product undergoing durability verification, resulting in the failure to complete the verification normally.

The cause of the damage to the verified product is not yet clearly determined

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