Imaging simulation method and system for detecting polaroid internal defects

Abstract

The invention provides an imaging simulation method and system for detecting polaroid internal defects. A light source model, a polaroid model having the interior containing defects and a receiving screen model are constructed in optical simulation software; the light source model is a black and white stripe light source or a stripe light source formed by allowing light emitted from a point light source to pass through a grating, and the polaroid model is a thin lens model formed by combining multiple layers of transparent and isotropic polymer thin films and established with the interior having the transparent defects, so as to realize the simulation imaging system for detecting the polaroid internal defects; by adjusting various parameters of the imaging simulation system, various parameters of the system having a best defect imaging effect are found out, so that guidance is provided for design of the actual polaroid internal defect detection system, the blindness of the prior art during design of the detection system and performing of defect detection is overcome, and the polaroid internal transparent defect detection accuracy and speed can be effectively improved.

Description

technical field [0001] The invention relates to the field of optical simulation, in particular to an imaging simulation method and system for detecting internal defects of polarizers. Background technique [0002] Polarizer (polarizing film) is a common polarizing optical element, which is widely used. For example, in TFT-LCD liquid crystal panel, there must be two polarizers with orthogonal polarization directions. Generally speaking, the finished TFT-LCD polarizer is composed of 6 layers of transparent polymer films, such as figure 1 As shown, from top to bottom, there are: protective film 01, TAC film 02, PVA film 03, TAC film 04, pressure sensitive adhesive 05 and release film 06, and the thickness of each layer is about tens of microns. The refractive index of each layer of material is very close, so the transmittance is high (about 42%, only incident light with one polarization direction can pass through; if the incident light is linearly polarized, and the polarizati...

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Problems solved by technology

[0007] In view of the deficiencies in the above-mentioned prior art, the purpose of the present invention is to provide users with an imaging simulation method and system for detecting internal defects of polarizers, which overcomes the search for the best parameters for imaging enhancement in the prior art, When detecting internal defects of polarizers, there are defects of high blindness and low efficiency

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