Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A two-dimensional linear measuring head with direct incident optical arm amplification

A measuring head and direct technology, applied in the field of precision measurement, can solve the problems of high cost, low precision, complex structure, etc., and achieve the effect of simplifying structure, improving measurement accuracy and reducing production cost

Active Publication Date: 2019-06-07
CHENGDU ZHONGKE ZHUOER INTELLIGENT TECH GRP CO LTD
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to overcome the above disadvantages of low precision of the mechanical probe and trigger probe in the prior art, and the complex structure and high cost of the scanning probe, and provide a simple structure and high measurement accuracy. The direct-incidence optical arm amplified two-dimensional linear probe can move in a known plane to compensate the measurement deviation when the measured workpiece is positioned due to the displacement of the measuring ball when it touches the measured workpiece, and obtain the measured workpiece. More accurate measurement coordinates of the workpiece

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A two-dimensional linear measuring head with direct incident optical arm amplification
  • A two-dimensional linear measuring head with direct incident optical arm amplification
  • A two-dimensional linear measuring head with direct incident optical arm amplification

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0057] Such as figure 1 As shown, a direct-incidence optical arm amplified two-dimensional linear measuring head, including:

[0058] Two laser sources are used to emit two laser beams, that is, laser source one 11 emits laser beam one 21, and laser source two 12 emits laser beam two 22;

[0059] Probe base 4, said probe base 4 is provided with laser source one 11 and laser source two 12, and measuring rod 6 and measuring ball 7 for detection;

[0060] Two photodetectors, i.e. photodetector 1 31 and photodetector 2 32, are respectively used to receive laser beam 1 21 and laser beam 2 22;

[0061] A translation component, used to make the probe base 4 move linearly;

[0062] Recovering part 5, used for returning probe base 4 to the initial position;

[0063] The processing system calculates the displacement change value of the measuring ball 7 according to the change value of the incident position of the laser beam 1 21 and the laser beam 2 2 received by the photodetector 1 ...

Embodiment 2

[0074] Such as Figure 6 As shown, a direct-incidence optical arm amplified two-dimensional linear measuring head, including:

[0075] Two laser sources are used to emit two laser beams, that is, laser source one 11 emits laser beam one 21, and laser source two 12 emits laser beam two 22;

[0076] Two photodetectors, i.e. photodetector 1 31 and photodetector 2 32, are respectively used to receive laser beam 1 21 and laser beam 2 22;

[0077] Probe base 4, said probe base 4 is provided with a photodetector one 31, a photodetector two 32, and a measuring rod 6 and a measuring ball 7 for detection;

[0078] A translation component, used to make the probe base 4 move linearly;

[0079] Recovering part 5, used for returning probe base 4 to the initial position;

[0080] The processing system calculates the displacement change value of the measuring ball 7 according to the change value of the incident position of the laser beam 1 21 and the laser beam 2 2 received by the photodet...

Embodiment 3

[0087] The direct-incidence optical arm amplified two-dimensional linear measuring head in this embodiment is basically the same as that in Embodiment 1, only the translation part and the recovery part are realized by a double reed structure, and the specific structure includes:

[0088] Two laser sources are used to emit two laser beams, that is, laser source one 11 emits laser beam one 21, and laser source two 12 emits laser beam two 22;

[0089] Two photodetectors, i.e. photodetector 1 31 and photodetector 2 32, are respectively used to receive laser beam 1 21 and laser beam 2 22;

[0090] Probe base 4, said probe base 4 is provided with laser source one 11, laser source two 12, and measuring rod 6 and measuring ball 7 for detection;

[0091] Such as Figure 8 As shown, the translation part and the return part are used to make the probe base 4 move linearly, and then return the probe base 4 to the initial position after the measurement is completed. In this embodiment, the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a direct incident type light arm amplifying two-dimensional linear probe. The probe comprises two laser sources for transmitting two laser beams, a probe base which is used for fixing a measurement rod and a measurement ball and provided with the laser sources or two photoelectric detectors, the two photoelectric detectors for receiving the two incident laser beams, a translation part for driving the probe base to move linearly, a reset part for resetting the probe base to an initial position, and a processing system for obtaining the displacement change value of the measurement ball. The probe can obtain the displacement values in two different linear directions through the two photoelectric detectors to compensate for the measurement deviation of a to-be-measured workpiece during positioning and to obtain more accurate measurement coordinates. The two-dimensional linear probe is improved in measurement precision, simplified in structure, reduced in production cost, and easy for batch processing and production.

Description

technical field [0001] The invention relates to the technical field of precision measurement, in particular to a novel optical arm amplifying two-dimensional line measuring head. Background technique [0002] The probe is one of the key components of the precision measuring instrument. As a sensor, it provides the geometric position information of the workpiece to be measured. The development level of the probe directly affects the measurement accuracy and efficiency of the precision measuring instrument. Precision probes are usually divided into contact probes and non-contact probes, of which contact probes are divided into mechanical probes, trigger probes and scanning probes; non-contact probes are divided into laser probes probes and optical video probes. [0003] The mechanical probe is an earlier type of probe used in precision measuring instruments. The probe is used for position measurement through direct contact between the probe end and the workpiece to be measur...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00
Inventor 张白潘俊涛康学亮
Owner CHENGDU ZHONGKE ZHUOER INTELLIGENT TECH GRP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com