A Multiple Defect Detection Method Based on Image Block Variance-Weighted Eigenvalues

A technology of weighted eigenvalues ​​and image segmentation, which is applied in the field of multi-defect detection, can solve the problems of difficulty in online detection, difficult to meet production efficiency, easy to fatigue, etc., achieves low detection rate of missed detection and false detection, and has self-adaptive ability. , the effect of high detection accuracy

Active Publication Date: 2018-11-09
GUANGDONG UNIV OF TECH
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are the following problems: 1) Manual inspection of products is difficult to meet the needs of production efficiency; 2) Inspection work requires a large number of workers, which greatly increases production costs; 3) Manual inspection is labor-intensive, prone to fatigue, inconsistent inspection standards, and easy false detection
[0004] The surface defect of the strip object shows that there is no abnormality in the outline of the object, but there are cracks on the surface of the object. The reason for the surface defect is that the heat seal of the side end is not firm or the friction during the movement
In the actual production process, the number of strip-shaped objects with such defects is relatively small, but surface defects are still an important reason affecting product quality, and online detection of such defects is relatively difficult
The reason is that the surface defects of strip objects are irregular and their positions are randomly distributed, which cannot be predicted in advance, and there are texts on the surface, and the positions of the texts are also uncertain; such defects only account for a small part of the total target detection area, usually no more than 5% ;During the packaging process, the strip-shaped object presents the characteristics of fast movement
Therefore, the traditional method of detecting all target areas is not suitable for the rapid detection requirements of the packaging process of strip objects

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Multiple Defect Detection Method Based on Image Block Variance-Weighted Eigenvalues
  • A Multiple Defect Detection Method Based on Image Block Variance-Weighted Eigenvalues
  • A Multiple Defect Detection Method Based on Image Block Variance-Weighted Eigenvalues

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0047] The invention adopts the multi-defect online detection method based on image block variance-weighted characteristic value, which is an improved and comprehensive method. Its purpose is to detect all defect targets in the image at the same time. This method first divides the preprocessed image into blocks, and extracts the potential defect position sub-image by comparing the variance of the image with the variance of the block sub-image; then performs weighting processing on the defect sub-image to construct a multidimensional weighted covariance matrix, Calculate the eigenvalue of the weighted covariance matrix, and finally determine the weighted eigenvalue λ 1 ,λ 2 The value of determines whether the subimage contains defects:

[0048] Step1: If the weighted eigenvalue λ 1 ,λ 2 If the value of is similar, there is no defect in the sub-image block;

[0049] Step2: If the weighted eigenvalue λ 1 Much larger than the weighted eigenvalue λ 2 , then there is a defect...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention is a multi-defect detection method based on image block variance-weighting eigenvalues. The method of the present invention determines defects by using an image block to extract a sub-image, and weighting covariance to calculate a weighting eigenvalue. The image block aims at removing sub-images with relatively small variance values, by comparing image variance with block sub-image variance, to obtain sub-images including potential defects as an eigenvalue of the next step. Then a weighting covariance matrix is established by using principal components analysis, and defect positions are determined by calculating weighting eigenvalues. According to the detection method of the present invention, multi-defect of a strip can be simultaneously on-line detected, a plurality of surface defects in an image can be once detected, and the detection and localization of the multi-defect strip target can be accurately achieved. The detection method has features of high detection speed, good real-time, and a high detection accuracy rate.

Description

technical field [0001] Aiming at multiple defects on the surface of strip objects, the present invention proposes a multi-defect detection method based on image block variance-weighted eigenvalue (IPV-WEV). The invention is suitable for on-line detection of multiple defects on the surface of strip objects or similar objects, and belongs to the intersecting fields of machine vision and packaging engineering. . Background technique [0002] The packaging of strip objects, such as: ham sausage, industrial explosives, etc., is the last process of product production, and the quality of packaging directly affects the quality of products. Due to many reasons, there will be defects on the packaging surface of strip objects during the packaging process, and there are many surface crack defects in the image. Once these objects with defective packaging quality are missed and enter the user link, it will bring serious economic losses and negative impacts to users and enterprises. The...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00
CPCG06T7/0002G06T7/001G06T2207/30168
Inventor 许亮苏培权何小敏刘学福
Owner GUANGDONG UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products