Reaction kettle used for diode failure analysis experiment

Abstract

The invention discloses a reaction kettle used for a diode failure analysis experiment in the diode detection technology field. The reaction kettle comprises a body and an end cap. The body is in a circular cup shape and an upper end of the body is opened. An inner wall and a bottom of the body are provided with annular grooves. Heating wires are fixed into the grooves. An outer side of the heating wires is provided with a reaction cup. The end cap is hinged to one side of the upper end of the body through a hinge. A shape of the end cap matches with the body. The end cap is provided with several drain holes. A lower end of one side of the end cap is bulged downwardly to form a clamping bench, wherein the side of the end cap is opposite to the hinge. One side of the upper end of the body, which is opposite to the hinge, is provided with a clamping groove. The clamping bench and the clamping groove are cooperated. In the scheme, the heating wires are used to heat the reaction cup so that instability and dangerousness of the experiment are reduced; through setting the end cap with the drain holes, a sample can be prevented from dropping; the experiment does not need to be repeated and experiment efficiency is increased.

Description

technical field [0001] The invention relates to the technical field of diode detection, in particular to a reaction kettle for diode failure analysis experiments. Background technique [0002] During long-term use, diodes will fail due to various reasons and cannot work normally, which will seriously affect the normal use of electronic devices. In order to reduce the occurrence of diode failure, failure analysis experiments are usually carried out on failed diodes to find out the cause of diode failure, and then make targeted improvements to the diode. The experimental process is to collect samples of short-circuit failures in the use of diodes and screen failure data such as stress conditions or service conditions, and conduct electrical parameter tests, cap removal, protective glue removal, die and electrode separation, solder removal, and microscopic observation of these samples. Steps to find out the failure location, analyze the internal quality factors or use factors ...

AI Technical Summary

Problems solved by technology

[0002] During long-term use, diodes will fail due to various reasons and cannot work normally, which will seriously affect the normal use of electronic devices

The existing experiment is a manual operation throughout the whole process, which requires manual contact with various strong acids, and the beaker needs to be heated through an alcohol lamp and an asbestos net. The labor intensity of the experimenter is high and easy to fatigue, and there is a certain degree of instability and danger.

Moreover, it is necessary to manually pour out the discarded acid solution from the beaker after corrosion. Due to the large diameter of the beaker, the corroded diode is also very easy to be poured out along with the acid solution, resulting in the waste of experimental samples and repeated experiments, which reduces the cost of the experiment. Higher, the efficiency of the failure analysis experiment is low, and it is very inconvenient to conduct the failure analysis experiment on the diode

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