Electrostatically formed film reflecting surface antenna analysis method

An analysis method, electrostatic forming technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc.

Active Publication Date: 2016-03-23
XIDIAN UNIV
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Problems solved by technology

[0004] The purpose of the present invention is to solve the problem of the influence of film deformation on electrostatic force in electrostatic film reflectors, and provide a fast analysis method for electrostatically formed film reflector antennas considering the influence of film deformation on electrostatic force; based on finite element method Use Matlab programming to analyze the deformation of the film. During the analysis process, the geometric nonlinear problem of the film structure is considered. At the same time, the electrostatic force is expressed as a function of the displacement of the unit node. The exponential loading method is used for the incremental solution to realize the consideration of the film deformation on the electrostatic force. Fast analysis of the effects of electrostatically formed thin film reflector antennas

Method used

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  • Electrostatically formed film reflecting surface antenna analysis method
  • Electrostatically formed film reflecting surface antenna analysis method
  • Electrostatically formed film reflecting surface antenna analysis method

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Embodiment Construction

[0043] like figure 1 Shown is a method for analyzing an electrostatically formed film reflector antenna, which is characterized in that it at least includes the following steps:

[0044] Step 101: According to the caliber D of the reflective surface of the electrostatic film a Establish a finite element model of the thin-film reflective surface with the focal length f, and divide the thin-film reflective surface into grids with planar triangular thin-film elements, with a total of N thin-film elements and M nodes;

[0045] Step 102: Input the force convergence condition and the total number of incremental steps J=a required for each step of equilibrium iteration when solving the finite element model of the thin film reflection surface b , where a and b are exponential incremental step control factors, given the prestress σ of each membrane element 0 =[σ x0 σ y0 σ xy0 ] T , where σ x0 , σ y0 and σ xy0 are the prestress values ​​in the x direction, y direction and xy di...

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Abstract

The invention belongs to the technical field of radar antennas, and particularly provides an electrostatically formed film reflecting surface antenna analysis method. The method comprises the following steps: firstly, establishing a film reflecting surface finite element model, expressing electrostatic force into an element node displacement function to be exerted into a model, and then conducting model solution by applying an exponential type increment loading manner to obtain film reflecting surface deformation. Compared with the prior art, the film reflecting surface deformation obtained by adopting the method is accurate in result and relatively high in computational efficiency.

Description

technical field [0001] The invention belongs to the technical field of radar antennas, and relates to a fast analysis method for an electrostatically formed film reflective surface antenna considering the influence of film deformation on electrostatic force. Specifically, it is an analysis method for electrostatically formed film reflector antennas, which is used to accurately and quickly analyze the deformation of films under the action of electrostatic force, and the exponential incremental loading method used to solve nonlinear equations is universal. Background technique [0002] The working principle of the electrostatically formed film reflector antenna (ECDMA) is to apply different voltages on the film reflector coated with a metal layer and the control electrode (generally the film is an equivalent zero potential surface, and the electrode is a high potential), generating an electrostatic force on the The film is stretched so that the film forms a reflective surface ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 谷永振杜敬利姜文明秦东宾张逸群张树新
Owner XIDIAN UNIV
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