A defect location device for ultrasonic testing

Abstract

A related defect positioning apparatus applied to ultrasonic detection is characterized in that the apparatus comprises an installation mounting base and a right-angle measuring scale; the right-angle measuring scale comprises a first measuring scale and a second measuring scale fixedly connected with one end of the first measuring scale, and the scale surface of the first measuring scale is perpendicular to the scale surface of the second measuring scale; a slideway is disposed on the installation mounting base, and the first measuring scale is connected in the slideway in a sliding way; and the second measuring scale is provided with a flexible arrowhead in a sliding way. A double positioning manner in a plane is employed, and a point in a plane can be precisely positioned, a defect position is facilitated to be precisely determined, and defects are facilitated to be timely cleared and repaired.

Description

technical field [0001] The invention relates to a defect location device for ultrasonic detection. Background technique [0002] The basic principle of ultrasonic nondestructive testing is to use the material discontinuity caused by the existence of inhomogeneous defects in homogeneous materials. This discontinuity will produce interfaces of different sizes inside the material, resulting in inconsistencies in acoustic impedance. Ultrasonic waves will reflect on the interface (or "defect") of different acoustic impedances. Ultrasonic flaw detection uses the appearance of reflected waves at this interface to determine the position and size of defects in the workpiece. [0003] During ultrasonic testing, the reflected wave of the defect interface (the discontinuity of the material) will be displayed on the oscilloscope of the ultrasonic flaw detector. The oscilloscope can directly display the position and size of the reflected sound wave through the linear proportional relation...

AI Technical Summary

Problems solved by technology

[0005] When finding the highest reflected wave of a defect, it is necessary to hold the probe and move the probe slightly near the defect position, and find out the highest point according to the change of the reflected wave. After finding the highest point, the reflected wave in the workpiece can be read on the oscilloscope screen. Position-related values, according to the relevant data displayed on the oscilloscope screen, the position of the defect is actually measured on the workpiece through a ruler. However, the flaw detection process is carried out continuously, and the ruler is not easy to carry. The ruler cannot be accurate to the center of the flaw detection, so the position of the defect is roughly measured by combining visual inspection and a ruler, so the operation has greater inaccuracy

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