All polarization-maintaining fiber laser fractional array generation device for stimulated emission depletion microscopy

Abstract

The invention discloses a fully polarization-maintaining fiber laser lattice generation device for stimulated emission loss microscope, which includes a half-wave plate, a coupling objective lens, a polarization-maintaining fiber coupler, and an optical fiber fixed sequentially arranged along the propagation direction of the excitation light. device, beam reducer and high numerical aperture objective lens; multiple polarization-maintaining optical fibers at the exit end of the polarization-maintaining fiber coupler are each provided with a polarization controller; the ends of the multiple polarization-maintaining optical fibers at the exit end of the polarization-maintaining fiber coupler pass through Fiber Fixtures. The device of the present invention has the advantages of simple and compact structure, convenient adjustment, stable operation, and relatively low loss. It can provide a large-scale grid for STED microscopes with large coverage area, spot spacing about half the wavelength of the incident light, and consistent laser spot shape. De-excite the laser lattice.

Description

technical field [0001] The invention relates to an all-polarization-maintaining fiber laser lattice generating device for a stimulated emission loss microscope. Background technique [0002] In traditional optical microscopy, due to the limitation of "Abbe's diffraction limit", the resolution limit size of the microscopic system is about half of the wavelength of the light wave used. Stimulated emission depletion (STED, stimulated emission depletion) microscopy is a new type of far-field optical microscopy technology. Firstly, one beam of excitation light is used to excite the fluorescent molecules of the sample, and then another beam of laser, namely the excitation light, is used to suppress the sample. The autofluorescent radiation of the fluorescent molecules can greatly compress the spatial size of the fluorescent signal of the sample, and finally achieve nanometer-level resolution. Among them, the key to break through the diffraction limit of STED microscope is the dep...

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Problems solved by technology

However, using this method to realize the dot-matrix passive light-emitting spot has a large body of light path, and the light path is very complicated, which brings many difficulties to the construction of the entire STED system and the adjustment of the light path.

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