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Spatial resolution measuring device of X-ray planar detector

A technology of spatial resolution and measuring device, which is applied in the direction of television, electrical components, image communication, etc., can solve problems such as difficult production, and achieve the effect of improving measurement accuracy and reducing production difficulty.

Active Publication Date: 2016-04-20
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the line pair density value of the resolution board is greater than 20Lp / mm, the line and space width is only less than 25μm, which is difficult to manufacture

Method used

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  • Spatial resolution measuring device of X-ray planar detector
  • Spatial resolution measuring device of X-ray planar detector
  • Spatial resolution measuring device of X-ray planar detector

Examples

Experimental program
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Embodiment 1

[0022] figure 1 It is a structural schematic diagram of the spatial resolution measuring device of the X-ray plane detector of the present invention, figure 2 Schematic diagram of the 10.0Lp / mm resolution plate. exist Figure 1~Figure 2 Among them, the spatial resolution measuring device of the X-ray plane detector of the present invention comprises an X-ray tube 1, a resolution plate 3, a filter plate 6 and an X-ray framing camera, and the X-ray framing camera is composed of a cathode microstrip 12, an Frame changing tube 13 and CCD camera 14 constitute, and cathode microstrip 12 is plated on the microchannel plate of frame changing tube 13, and frame changing tube 13 is closely coupled with CCD camera 14; Resolution plate 3 and A pinhole 11 is arranged between the X-ray framing cameras, and the central light 15 emitted by the X-ray generating device passes through the center of the resolution plate 3, the center of the filter 6, the pinhole 11, and the center of the catho...

Embodiment 2

[0026] figure 1 It is a structural schematic diagram of the spatial resolution measuring device of the X-ray plane detector of the present invention, image 3 A schematic diagram of a fan-shaped resolution board. Except that the resolution plate 3 is different from the embodiment 1, other structures of the spatial resolution measuring device of the X-ray plane detector are the same. Such as image 3 As shown, the resolution board 3 in this embodiment is a fan-shaped resolution board, and the line pair density gradually changes from 1.0 Lp / mm to 10.0 LP / mm, and the corresponding scale values ​​are indicated. Adjust the translation stage Ⅰ5 and translation stage Ⅱ8, set the imaging magnification M=0.2, the line pair bundle recorded by the CCD camera 9 is just indistinguishable at the scale value of 5.0Lp / mm, then the spatial resolution of the gated frame camera is 5.0Lp / mm÷0.2=25.0Lp / mm.

[0027] It can be understood that the line pair density of the resolution board in Emb...

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Abstract

The invention provides a spatial resolution measuring device of an X-ray planar detector. The device comprises an X ray generating device, a resolution board, a filter plate and an X-ray planar detector, wherein a pin hole is formed between the resolution board and the X-ray planar detector, and a central ray emitted from the X ray generating device sequentially passes through the center of the resolution board, the center of the filter plate, the pin hole and the center of a photosensitive surface of the X-ray planar detector. A translational table I drives the resolution board to move along a light path direction, and a translational table II drives the pin hole to move along the light path direction so as to adjust the amplification factor of a pin-hole imaging system, and the resolution board is enabled to be imaged on the photosensitive surface of the X-ray planar detector so as to generate a measured line pair beam. The spatial resolution measuring device of the X-ray planar detector, provided by the invention, has the advantages that the spatial resolution and accuracy of measurement are improved, the difficulty of manufacturing of the resolution board is lowered, and the photosensitive surface of the X-ray planar detector is not damaged.

Description

technical field [0001] The invention belongs to the field of image quality evaluation, and in particular relates to a spatial resolution measuring device of an X-ray plane detector. Background technique [0002] In the research and application of plasma diagnosis, non-destructive testing, medical imaging, etc., X-ray plane detectors are widely used as the recording medium of X-ray imaging systems. Spatial resolution is one of the most important indicators for evaluating the imaging performance of X-ray planar detectors. Generally, the spatial resolution measurement device of X-ray plane detector includes: X-ray source, resolution plate, filter and X-ray plane detector. There are two measurement methods. On the photosensitive surface of the X-ray plane detector, the spatial resolution of the X-ray plane detector can be obtained by irradiating the resolution plate with the X-ray source. This method can accurately measure the spatial resolution, but because the resolution pla...

Claims

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Application Information

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IPC IPC(8): H04N17/00
CPCH04N17/00
Inventor 杨志文刘慎业陈韬袁铮李晋黎宇坤高扬余建董建军
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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