Spatial resolution measuring device of X-ray planar detector

A technology of spatial resolution and measuring device, which is applied in the direction of television, electrical components, image communication, etc., can solve problems such as difficult production, and achieve the effect of improving measurement accuracy and reducing production difficulty.

Active Publication Date: 2016-04-20
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
View PDF3 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the line pair density value of the resolution board is greater than 20Lp

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Spatial resolution measuring device of X-ray planar detector
  • Spatial resolution measuring device of X-ray planar detector
  • Spatial resolution measuring device of X-ray planar detector

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0021] Example 1

[0022] figure 1 It is a schematic structural diagram of the spatial resolution measuring device of the X-ray planar detector of the present invention, figure 2 It is a schematic diagram of a 10.0Lp / mm resolution board. in Figure 1~Figure 2 In the present invention, the spatial resolution measuring device of the X-ray flat detector includes an X-ray tube 1, a resolution plate 3, a filter 6, and an X-ray framing camera. The X-ray framing camera consists of a cathode microstrip 12 and a framing camera. A variator tube 13 and a CCD camera 14 are formed, the cathode microstrip 12 is plated on the microchannel plate of the framing variator 13, and the framing variator 13 and the CCD camera 14 are closely coupled and connected; the resolution plate 3 and A pinhole 11 is provided between the X-ray framing cameras, and the central light 15 emitted by the X-ray generator passes through the center of the resolution plate 3, the center of the filter 6, the pinhole 11, a...

Example Embodiment

[0025] Example 2

[0026] figure 1 It is a schematic structural diagram of the spatial resolution measuring device of the X-ray planar detector of the present invention, image 3 It is a schematic diagram of a sector resolution board. Except that the resolution plate 3 is different from the embodiment 1, the other structures of the spatial resolution measuring device of the X-ray flat detector are the same. Such as image 3 As shown, the resolution plate 3 in this embodiment is a sector-shaped resolution plate, and the line pair density is gradually changed from 1.0Lp / mm to 10.0LP / mm, indicating the corresponding scale value. Adjust the translation stage I5 and Ⅱ8, set the imaging magnification M=0.2, and the line pair beam recorded by the CCD camera 9 is just indistinguishable at the scale value of 5.0Lp / mm, then the spatial resolution of the gated framing camera is 5.0Lp / mm÷0.2=25.0Lp / mm.

[0027] It can be understood that the line pair density of the resolution plate in Embod...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a spatial resolution measuring device of an X-ray planar detector. The device comprises an X ray generating device, a resolution board, a filter plate and an X-ray planar detector, wherein a pin hole is formed between the resolution board and the X-ray planar detector, and a central ray emitted from the X ray generating device sequentially passes through the center of the resolution board, the center of the filter plate, the pin hole and the center of a photosensitive surface of the X-ray planar detector. A translational table I drives the resolution board to move along a light path direction, and a translational table II drives the pin hole to move along the light path direction so as to adjust the amplification factor of a pin-hole imaging system, and the resolution board is enabled to be imaged on the photosensitive surface of the X-ray planar detector so as to generate a measured line pair beam. The spatial resolution measuring device of the X-ray planar detector, provided by the invention, has the advantages that the spatial resolution and accuracy of measurement are improved, the difficulty of manufacturing of the resolution board is lowered, and the photosensitive surface of the X-ray planar detector is not damaged.

Description

technical field [0001] The invention belongs to the field of image quality evaluation, and in particular relates to a spatial resolution measuring device of an X-ray plane detector. Background technique [0002] In the research and application of plasma diagnosis, non-destructive testing, medical imaging, etc., X-ray plane detectors are widely used as the recording medium of X-ray imaging systems. Spatial resolution is one of the most important indicators for evaluating the imaging performance of X-ray planar detectors. Generally, the spatial resolution measurement device of X-ray plane detector includes: X-ray source, resolution plate, filter and X-ray plane detector. There are two measurement methods. On the photosensitive surface of the X-ray plane detector, the spatial resolution of the X-ray plane detector can be obtained by irradiating the resolution plate with the X-ray source. This method can accurately measure the spatial resolution, but because the resolution pla...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H04N17/00
CPCH04N17/00
Inventor 杨志文刘慎业陈韬袁铮李晋黎宇坤高扬余建董建军
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap