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x-ray source using linear accumulation

An X-ray and characteristic technology, applied in X-ray tubes, X-ray equipment, parts of X-ray tubes, etc., to achieve the effect of large X-ray brightness

Active Publication Date: 2019-12-10
SIGRAY INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the lateral dimension, there are the same conduction problems as in the bulk material

Method used

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  • x-ray source using linear accumulation
  • x-ray source using linear accumulation
  • x-ray source using linear accumulation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0114] 1. Basic embodiment of the present invention

[0115] Figure 7 An embodiment of a reflective x-ray system 80-A in accordance with the present invention is shown. As in the prior art reflective x-ray system 80 described above, the source comprises a vacuum environment (typically 10 -6 Torr or better), the vacuum environment is usually maintained by a sealed vacuum chamber 20 or active suction, and is made with sealed electrical leads 21 and 22 from the high voltage power source 10 outside the tube. The negative and positive terminals are communicated to various elements within the vacuum chamber 20 . The source 80-A will typically include a bracket 30 that secures the vacuum chamber 20 in the housing 50, and the housing 50 may additionally include a shielding material, such as lead, to prevent x-rays from being emitted by the source 80-A in undesired radiate in the direction.

[0116] As before, within chamber 20 , emitter 11 , connected to high voltage power supply...

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Abstract

This application discloses a compact source for high brightness x-ray generation. Higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This is achieved by aligning discrete x-ray emitters, or through use of novel x-ray targets comprising a number of microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and allows bombardment of this material with higher electron density and / or higher energy electrons, leading to greater x-ray brightness. The orientation of the microstructures allows the use of an on-axis collection angle, allowing accumulation of x-rays from several microstructures to be aligned, appearing to have a single origin, also known as "zero-angle" x-ray emission.

Description

[0001] related application [0002] This patent application claims priority to and benefit from: U.S. Provisional Patent Application No. 61 / 880,151, filed September 19, 2013; U.S. Provisional Patent Application No. 61 / 894,073, filed October 22, 2013 ; U.S. Provisional Patent Application No. 61 / 931,519, filed January 24, 2014; U.S. Provisional Patent Application 62 / 008,856, filed June 6, 2014; and U.S. Provisional Patent Application No. 6, filed September 19, 2014 Application No. 14 / 490,672, all of which are incorporated herein by reference in their entirety. This application is also related to US Patent Application 14 / 465,816, filed August 21, 2014, which is also incorporated herein by reference in its entirety and is included in part as Appendix A. technical field [0003] Embodiments disclosed herein relate to high-brightness sources of x-rays. This high-brightness source is suitable for a variety of applications employing x-rays, including manufacturing inspection, metrol...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J35/14H05G1/32
CPCH01J35/105H01J2235/084H01J2235/086
Inventor 云文兵西尔维娅·贾·云·路易斯雅诺什·科瑞艾伦·弗朗西斯·里昂
Owner SIGRAY INC