X-ray phase contrast imaging system and X-ray imaging method

Abstract

The present invention relates to an X-ray imaging system and an X-ray imaging method. The X-ray imaging system is provided with a distribution type X-ray source, a fixed grating module, an X-ray detector and a computer workstation, wherein a detected objected is positioned between the distribution type X-ray source and the fixed grating module, and the computer workstation performs control so as to achieve the following process that various light sources of the distribution type X-ray source are sequentially exposed and emit X-rays to the detected object, the X-ray detector receives the X-rays during every exposing, the light intensities of the X rays at each pixel point position on the X-ray detector are represented as a light intensity curve through the one time stepping exposing process of the distribution type X-ray source and the data collection, the light intensity curve and the light intensity curve obtained in the case of absence of the detected object are compared, the pixel values of each pixel point are obtained through the change of the light intensity curve, and the image of the detected object is re-constructed according to the obtained pixel values.

Description

technical field [0001] The invention relates to an X-ray grating imaging technology, in particular to an X-ray phase contrast imaging system and an imaging method based on a distributed X-ray source. Background technique [0002] In existing technologies such as CT scanning equipment, X-rays are widely used to scan and image objects. Traditional X-ray scanning imaging generally uses the X-ray attenuation characteristics of the measured material to inspect the internal structure of the object in a non-destructive manner. The effect of traditional X-ray imaging technology is particularly significant if the density of the structural composition of each part inside the object is significantly different. However, for substances composed of light elements, they are weak absorbers for X-rays, so their internal specific structures can hardly be seen with traditional X-ray imaging techniques. Even if other auxiliary means are used, for example, it is difficult to obtain a clear ima...

AI Technical Summary

Problems solved by technology

[0005] But even so, the existence of stepping technology still poses a great obstacle to the promotion of grating imaging technology. The stepping of the mechanical system is very time-consuming, which greatly increases the scanning time. At the same time, even the translation of tens of microns still affects the accuracy of mechanical equipment. , overall equipment shockproof, ambient temperature, etc. have high requirements, these two aspects greatly limit the application and promotion of this new grating imaging technology

Images