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Large-scale complex curved surface measurement system and application thereof

A measurement system and technology for complex surfaces, applied in the field of large-scale complex surface measurement systems, can solve problems such as complicated preprocessing of lattice data, difficulty in ensuring the accuracy and efficiency of reconstructed surfaces, and poor stability.

Active Publication Date: 2016-06-01
SHANDONG UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because the preprocessing process of lattice data is very complicated and the stability is poor, it is difficult to guarantee the accuracy and efficiency requirements of the reconstructed surface

Method used

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  • Large-scale complex curved surface measurement system and application thereof
  • Large-scale complex curved surface measurement system and application thereof
  • Large-scale complex curved surface measurement system and application thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0063] Such as figure 1 and figure 2As shown in , a large complex curved surface measurement system, the system is based on the two-way space forward intersection principle to achieve the acquisition of large complex curved surface three-dimensional lattice device. The measurement system includes a base 1, a horizontal indexing plate 2, a horizontal support 3, a pitching support 4, a camera 5 and a camera 8, a laser range finder 6, a line laser transmitter 7, a pitching indexing plate 9, a data line interface 10, Data line 11 and computer 12; Horizontal index plate 2 and horizontal support 3 are fixed together, and both are installed on the top of base 1; Camera 5 and camera 8, and laser range finder 6 and line laser emitter 7 are installed on pitching On the support 4; the pitch support 4 is installed on the horizontal support 3; the pitch index plate 9 is fixedly installed on the pitch support 4, on the right side of the horizontal support 3; the computer 12 that is respon...

Embodiment 2

[0072] Based on the measurement system described in Embodiment 1, this embodiment elaborates in detail the method for measuring large complex curved surfaces using the measurement system described in Embodiment 1, the method is as follows:

[0073] 1. Data sampling and calculation of a single measurement area (the process of single-station measurement and calculation of the outer surface of the target object):

[0074] as attached image 3 As shown, the outer surface 14 of the measured object is divided into n regions, and the measurement system 13 is placed directly against a certain measurement region i. The point laser 18 emitted by the laser rangefinder is approximately perpendicular to the outer surface 14 of the measured object, and the vertical foot is Position point 16; position point 15 and position point 17 are the measurement start point and end point respectively. The single-station measurement is carried out by using the laser cycle scanning and camera capture to...

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Abstract

The invention relates to a large-scale complex curved surface measurement system and an application thereof. The measurement system comprises a pedestal, a horizontal support, a pitching support, and a computer. The horizontal support is disposed on the pedestal, and the pitching support is connected with the horizontal support. The pitching support is provided with cameras, a laser range finder, and a linear laser emitter. Two sides of the laser range finder are provided with two cameras. The computer is electrically connected with the cameras, the laser range finder and the linear laser emitter. The measurement system obtains image data through point laser positioning, linear laser sampling and the cameras, obtains images in a photographing mode, calculates the actual coordinates of pixels through employing the principle of photogrammetry, and finally carries out the data reconstruction of a complex curved surface in the same coordinate system through data jointing. The measurement system and sampling method simplify the measurement process under the condition of guaranteeing the precision, reduce the measurement times, and greatly improve the measurement efficiency.

Description

technical field [0001] The invention relates to a large complex curved surface measurement system and its application, in particular to a measurement system for obtaining a large complex curved surface regular three-dimensional lattice by combining photogrammetry technology and laser technology, and a method for using the measurement system. Background technique [0002] With the development of the global economy, the market competition is becoming increasingly fierce, and the new technological revolution has made continuous progress and breakthroughs. The rapid development of technology has become an important factor in promoting the growth of the world economy. In order to maintain and strengthen the competitiveness of products in the market, the development cycle and production cycle of products are getting shorter and shorter, which promotes the development of industrial products in the direction of more varieties, small batches, high quality and low cost. There are more...

Claims

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Application Information

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IPC IPC(8): G01B11/24G01B11/00
CPCG01B11/002G01B11/24
Inventor 李学艺曾庆良张鑫吕永刚王宁宁张庆雪韩文广赵丹丹
Owner SHANDONG UNIV OF SCI & TECH
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