The virtual-real mapping method of ate resources

Abstract

The invention discloses a virtual-real mapping method of ATE resources, which divides the resources in ATE into three layers: virtual resources, logical instruments and physical instruments. The virtual resource layer completes the description of the signal properties of the virtual resources, and the logical instrument layer completes the classification according to the IVI specification. The parameter configuration of various types of instruments, the physical instrument layer completes the management of physical instruments; the method includes the following steps: configuring virtual resources, logical instruments and physical instruments; selecting virtual resources that need to be mapped; mapping virtual resources to on the matched logical channel of the corresponding logical instrument; map the logical channel to the matched physical channel of the corresponding physical instrument; configure the address and driver of the physical instrument. The invention realizes the signal-oriented characteristic and the instrument exchange characteristic of the test system, and improves the efficiency and flexibility of the test flow development.

Description

technical field [0001] The invention relates to computer-based automated testing technology, in particular to a mapping method between actual physical instruments and virtual resources in ATE (AutoTestEquipment, automatic testing equipment). Background technique [0002] In the past automatic test system development process, test process developers not only need to understand the signal characteristics of the unit under test, but also understand the instrument parameter configuration process used in the test to complete the development process of a test process, and all processes Configuration parameters are set for specific instruments, which brings some problems as follows: [0003] 1. There are high technical requirements for process developers. Process developers are generally more concerned and good at signal analysis of UUT (UnitUnderTest, object under test) and logical structure analysis of the test process. In the previous process configuration process, each test po...

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Problems solved by technology

This greatly disperses the energy of process developers, thereby prolonging the cycle of test development and reducing the efficiency of test development

[0004] 2. When the instrument changes, a lot of modification work is required

Since all configurations in the process development process are completed for specific instruments, when the test instrument changes, it is usually the case that the parameter configuration process of the new instrument is completely different from that of the original instrument, so it is necessary to rewrite the driver and The new instrument configuration interface and reconfiguration of the test process also greatly reduce the efficiency of test development

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