Simulation system and simulation method for external synchronous time delay and integration CCD (Charge Coupled Device) sensor

Abstract

The invention discloses a simulation system and a simulation method for an external synchronous time delay and integration CCD (Charge Coupled Device) sensor. The simulation system comprises a TDICCD (Time Delay and Integration Charge Coupled Device) sensor, a pin electrical characteristic simulation circuit, a delay control module, a sensitivity control module, an integral series control module, an OS (Operating System) signal synthesis circuit and a drive characteristic extraction circuit, wherein the drive characteristic extraction circuit extracts an input signal from the TDICCD sensor through the pin electrical characteristic simulation circuit; the extracted signal is returned to the packaged output end of the TDICCD sensor through the OS signal synthesis circuit; the pin electrical characteristic simulation circuit is connected to the OS signal synthesis circuit through the integral series control module; the delay control module is connected to the pin electrical characteristic simulation circuit; and the sensitivity control module is connected to the OS signal synthesis circuit. The simulation system has the advantages of small volume, low power consumption and low cost, the functions of pin electrical characteristic, integral series control and video signal output of the TDICCD sensor are simulated and the sensitization characteristic of the pixel of the sensor is also simulated.

Description

technical field [0001] The invention relates to the technical field of sensor simulation, in particular to an external synchronous time delay integral CCD sensor simulation system and simulation method. Background technique [0002] TDICCD can obtain high sensitivity without sacrificing spatial resolution and working speed, so it has broad application prospects in aviation and aerospace fields. In actual work, due to the requirements of performance and indicators, it is often necessary to customize new TDICCD devices, which requires a certain development cycle and delivery cycle, sometimes as long as one to two years, which seriously affects the progress of scientific research and production tasks; In addition, The cost of TDICCD devices is often very high and the process is complicated. Some new TDICCD devices have very complicated driving requirements. They often use multiple power supplies to supply power together, and the sequence of power supply and power supply must me...

AI Technical Summary

Problems solved by technology

[0003] At present, the industry has begun to design various TDICCD waveform generators to solve the problem of test substitutes, but the disadvantage of these simulation devices is that they can only simulate the video images of TDICCD cameras, and cannot realize the photoelectric simulation of photosensitive pixels of TDICCD devices. Therefore, it cannot be directly applied in the process of machine assembly and adjustment

The circuits required to realize the video image simulation of TDICCD cameras are complex, bulky, and expensive, and the actual scope of use and convenience are very limited

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