Method and device for measuring part chamfer based on structured light vision

Abstract

The invention relates to the field of industrial part detection, and particularly relates to a method and a device for measuring a part chamfer based on structured light vision. In view of defects that the chamfer process applications are wide and large in the number, but the traditional detection technology is poor in adaptability and low in precision, and influences by subjective factors are large, the invention provides the method and the device for measuring the part chamfer based on structured light vision. The method sequentially comprises the following steps: structured light vision system calibration is carried out on a line-plane measurement model for a two-dimensional coplanar target; image pretreatment and feature information extraction are carried out on a part with a to-be-measured chamfer; and part chamfer feature parameters are calculated. Through the non-contact vision measurement technology, the possibility that the surface of the part is worn is reduced, chamfer feature parameter measurement with high precision, high adaptability and high efficiency is realized, and problems existing in the prior art can be well solved.

Description

technical field [0001] The invention relates to the field of industrial parts detection, in particular to a method and device for measuring part chamfers based on structured light vision. Background technique [0002] Most industrial parts have chamfers, such as the design of common shafts, shells, and cube parts. The design of chamfers can reduce the stress at the right-angled end of the workpiece itself, smooth transition during processing and assembly, and provide users with a good experience. It is an important process and feature of the product, with wide application and large quantity. The chamfer size and the number of chamfer angles are the two main parameters that determine the shape of the chamfer, and are also used to detect and measure the quality of the chamfer in the industry. At present, there is no good and effective detection method for the size parameters of the chamfer feature of the part on the manufacturing line. Most of them use targeted or special-pur...

AI Technical Summary

Problems solved by technology

The traditional detection method is to design and measure the mold or manual comparison and screening. This method is far from meeting the high-precision requirements of the mobile phone shell splicing parts detection, and the contact mold measurement is very easy to cause the area of ​​the inspected part to wear and be eliminated. Such The measurement method also has the defects of long time consumption and extremely low efficiency, which cannot meet the high detection requirements of products, nor can it meet the fast and efficient requirements of modern industrial manufacturing

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