Measurement texture geometric feature reconstruction method based on photometric stereo

A photometric stereo, geometric feature technology, applied in the field of measuring material geometric feature reconstruction, can solve the problem of surface reconstruction result deviation, systematic error, existence of low-frequency noise, etc., to achieve the effect of reducing the impact

Active Publication Date: 2016-07-20
SHANDONG UNIV
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  • Application Information

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Problems solved by technology

However, since the reflection model is assumed to be an ideal Lambert reflection model, in fact, there are non-Lambert abnormal parts in the input image sequence, which are easily affected by factors such as highlights, ...

Method used

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  • Measurement texture geometric feature reconstruction method based on photometric stereo
  • Measurement texture geometric feature reconstruction method based on photometric stereo
  • Measurement texture geometric feature reconstruction method based on photometric stereo

Examples

Experimental program
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Embodiment 1

[0089] The material of the selected sweater fabric is shown in Figure 3(a), as the measurement material to be reconstructed, and the data is taken by the photorealistic material measurement device in the camera light source array mode. The measuring device includes a workbench, on which a shooting bracket is fixed, and the shooting bracket includes a semicircular arc camera fixed arm, a semicircular arc light source rotating arm and a central rotating tray, and multiple cameras are mounted on the camera fixing arm, The fixed arm of the light source is provided with a plurality of light sources; the shooting bracket and the workbench are controlled by computer serial port programming.

[0090] Shooting with a measuring camera, and after data preprocessing steps such as multi-exposure-high dynamic range synthetic image (synthetic HDR), front view calibration, image preprocessing, etc., the pitch angle of the material at the viewing angle is obtained from 0 to 90 degrees (interval...

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Abstract

The invention discloses a measurement texture geometric feature reconstruction method based on photometric stereo. The method is characterized in that utilizing a realistic texture measuring device in a camera light source array mode to collect BTF data under different angle light sources and viewing angles; with measurement texture multi-view angle information being combined, optimizing a photometric stereo method and reconstructing normal information of the measurement texture; and reconstructing depth information of the measurement texture through a least square method in a measurement gradient field according to the normal information. More accurate normal information can be calculated when the input image sequence is influenced by non-Lamertian diffuse reflection parts of highlight and shadow and the like in the stage of calculating shadow information of the surface of the texture, and in the stage of calculating the depth information, influence of noise of the measurement gradient field on the depth is reduced through filtering.

Description

technical field [0001] The invention relates to a method for reconstructing geometric features of measured materials based on photometric stereo vision. Background technique [0002] In computer graphics, realistic rendering of complex materials such as cloth fabrics and skins has always been a great challenge. The difficulty with this type of problem is that the highly realistic rendering of a material relies on its geometric modeling as well as its material modeling. Geometric modeling describes the shape characteristics of objects, which is to construct the macroscopic geometric structure of the visible concave-convex features on the surface of the object, while the traditional macroscopic geometric model is not capable of expressing the material; The micro-geometry of the specular distribution. Different objects of the same geometric model, due to differences in surface geometry, material, density, color and other attributes, will present complex and rich optical pheno...

Claims

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Application Information

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IPC IPC(8): G06T15/20
CPCG06T15/205G06T2215/06
Inventor 徐延宁王璐岳双燕孟祥旭徐翔龚斌
Owner SHANDONG UNIV
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