Dual gate line array substrate, testing method, display panel and display device
A technology of array substrates and double gate lines, which is applied in semiconductor/solid-state device testing/measurement, electrical components, electric solid-state devices, etc., can solve problems such as defective pixels, undetectable, cost increases, etc., and improve the detection rate of pixels , Improve product quality control, improve the effect of product quality
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[0033] Embodiments of the present disclosure are described below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to enable those skilled in the art to more fully understand and practice the present disclosure. It will be apparent, however, to one skilled in the art that the present disclosure may be practiced without some of these specific details. Furthermore, it should be understood that the disclosure is not limited to the particular embodiments described. Rather, it is conceivable to implement the present disclosure in any combination of the features and elements described below, regardless of whether they relate to different embodiments. Accordingly, the following aspects, features, embodiments and advantages are by way of illustration only and should not be considered elements or limitations of the claims unless explicitly stated in the claims.
[0034] As used herein, a gate line including "ge...
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