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Optical measurement system and gas detection method

An optical measurement system, gas detection technology, applied in the field of optical measurement system and gas detection

Active Publication Date: 2019-12-17
AXETRIS AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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  • Optical measurement system and gas detection method
  • Optical measurement system and gas detection method
  • Optical measurement system and gas detection method

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Embodiment Construction

[0069] figure 1 The figure shows an optical measuring system 1 according to the invention for measuring spectra during gas detection, the optical measuring system comprising a first housing 2 with a laser diode arranged therein as a light emitter on an active temperature water bath 5 The inclined light of 4 can pass through the shell window 3. The measuring system 1 furthermore comprises a second housing 6 which is separate from the housing 2 and which comprises an inclined housing window 7 in which a light detector 8 is arranged. The two housings 2, 6 are arranged at a distance from each other, opposite each other and aligned with each other. The light emitter 4 and the light detector 8 form an optical component 20 of the measuring system 1 shown. A main beam of light 9 is emitted by the light emitter 4 , wherein the main beam of light is oriented centrally towards the housing window 3 . The main light beam 9 leaves the housing 2 and penetrates the gas or gas mixture 10 ar...

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Abstract

The invention relates to an optical measuring device and a method for gas detection. The optical measuring system comprises light emitters (4) arranged in at least one housing, and at least one light detector (8). The light emitter (4) emits a modulated main light beam (9) at a modulation span [delta][lambda] and an average wavelength [lambda]<0>. At least one light mechanical part (15) (for example, a housing window comprising an optical effective boundary surface) is arranged between the light emitter and the light detector, and results in a scattered light beam (11) which interfers with the main light beam so that self mixing is generated and / or an etalon is caused. So a measuring signal of the light detector comprises a main signal portion and an undesirable interfering signal portion. According to the invention, the at least one light mechanical part is arranged at a position having an optimized distance L relative to the light emitter and / or the light detector, and the optimized distance L is a function of the wavelength [lambda]<0> and the modulation span [delta][lambda] of the main light beam. The specially selected distance L prompts an influence of a minimized scattered light beam on the modulated signal so that increasement of sensitivity of a sensor is resulted in.

Description

technical field [0001] The invention relates to an optical measuring system comprising a light emitter and at least one light detector forming an optical component arranged in at least one housing, which optionally includes a forming Housing windows for optomechanical components and / or other optomechanical components, wherein the optomechanical component comprises an optically active boundary surface, wherein the light emitter has a modulation span Δλ, an average wavelength λ 0 Emitting a modulated main beam, wherein at least one of the main beams is partially reflected / scattered from the main beam in the direction of the light emitter and / or photodetector at least at an optically active boundary surface of the at least one optomechanical component The scattered beam causes self-mixing in the light emitter at the photodetector and / or the etalon at the photodetector by interference with the main beam, wherein the interference causes interference with the main beam such that the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/39
CPCG01N21/39G01N2021/399G01J3/4338G01N21/3504G01N2021/0396
Inventor A.维特曼M-O.朱费里U.伯格利K.哈斯勒
Owner AXETRIS AG