Relay-type stand-alone accelerated storage testing device and method

A technology for accelerated storage test and test device, which is applied in the field of relay-type single-machine accelerated storage test and test device, and can solve problems such as imperfection, less research on relay-type single-machine systems, and testing system monitoring single-machine storage degradation parameters.

Inactive Publication Date: 2016-08-17
HARBIN INST OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] At present, there has been some research on the storage test of relays at home and abroad, but there is still little research on relay single-unit systems. There is no special test system to monitor the storage degradation parameters of a single unit. Some current accelerated test methods are not perfect enough. , the reliability evaluation of a stand-alone machine is still in its infancy

Method used

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  • Relay-type stand-alone accelerated storage testing device and method
  • Relay-type stand-alone accelerated storage testing device and method
  • Relay-type stand-alone accelerated storage testing device and method

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Embodiment Construction

[0061] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0062] The relay-type stand-alone accelerated storage test device provided by the present invention is used to perform accelerated storage tests on multiple relay-type stand-alone machines. Each relay-type stand-alone machine includes a plurality of input and output terminals. Connector pins for external signal input and output in the figure 1 The schematic diagram of the structure of the relay-type stand-alone accelerated storage test device provided by the p...

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Abstract

The invention discloses a relay-type stand-alone accelerated storage testing device, and the device is used for the accelerated storage testing of a plurality of relay-type stand-alone units, wherein each relay-type stand-alone unit comprises a plurality of input/output terminals. The device comprises a plurality of constant temperature and constant humidity testing boxes, an intelligent alarm system, a terminal switching and control circuit, a contact resistance measurement circuit, a time parameter measurement circuit, and an upper computer system. The upper computer system is connected with the terminal switching and control circuit and the time parameter measurement circuit. The upper computer system sends a parameter setting command, a system self-testing command and a testing starting command to the terminal switching and control circuit and the time parameter measurement circuit. The terminal switching and control circuit is connected between the plurality of relay-type stand-alone units and the contact resistance measurement circuit. The contact resistance measurement circuit is used for testing the contact resistance value at each input/output terminal of the relay-type stand-alone units and transmitting the measured contact resistance values to the upper computer system.

Description

technical field [0001] The invention relates to the technical field of relay performance testing, in particular to a testing device and testing method for a single-machine accelerated storage test of relays. Background technique [0002] The relay type stand-alone is usually a type of electromechanical product composed of discrete devices such as relays, resistors, and diodes. It is widely used in defense weaponry systems such as missiles and rockets to complete functions such as signal transmission and system power supply and distribution. It is reliable. The reliability directly affects the reliability of the entire national defense weapon system. [0003] Modern weapons and equipment are stored in a long-term storage environment. Under the combined effects of temperature, humidity, vibration, and electrical stress, changes in their life and function indicators directly affect whether the missile can work reliably. Therefore, the research on the storage reliability of sin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/327
CPCG01R31/3278
Inventor 翟国富郑博恺付饶董宝旭叶雪荣林义刚
Owner HARBIN INST OF TECH
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