Transmission electron microscope sample rod capable of measuring nano-monomer absorption spectrum and use method thereof

Abstract

The invention discloses a transmission electron microscope sample rod capable of measuring nano-monomer absorption spectrum and a use method thereof. The sample rod comprises a shell of which the cross section is U-shaped; an incident optical fiber and a receiving optical fiber which are arranged in the U-shaped shell; an optical path generation and receiving device which is arranged at one end in the shell, and a piezoelectric ceramic driving cylinder, a metal copper cap and a metal probe which can be loaded on the metal copper cap; and a sample loading table which is arranged at the other end in the U-shaped shell, wherein the end head of the incident optical fiber stretches out of the U-shaped shell into the cavity of the sample rod, the end head of the receiving optical fiber is connected with quartz waveguide and also stretches out of the U-shaped shell into the cavity of the sample rod and is aligned with the end head of the incident optical fiber. Accurate movement of the metal copper cap and the metal probe is controlled through the piezoelectric ceramic driving cylinder, and a nano-monomer is transferred to the metal probe from the sample loading table and then the probe is moved to the end head of the incident optical fiber so as to realize measurement of the scattering and absorption spectrum of the nano-monomer.

Description

technical field [0001] The invention belongs to the optical property measurement field of transmission electron microscope in-situ experiments, and in particular relates to the design of an in-situ sample rod for characterizing the absorption and scattering spectra of nano monomers. Background technique [0002] Nowadays, with the development of microelectromechanical systems (MEMS) and breakthroughs in nanoelectromechanical systems (NEMS), the size of many structural units in devices has begun to move below twenty nanometers. At this scale, bottom-up self-assembled nanomaterials have unique advantages, so their various physical properties have attracted widespread attention. Transmission electron microscopy is an important method to analyze and characterize the structural information of nanomaterials. With the development of in-situ measurement technology based on transmission electron microscopy, the measurement of physical properties of various aspects of nano-monomers (...

AI Technical Summary

Problems solved by technology

However, this measurement method is usually a comprehensive optical property presented by a large number of nanomaterial monomers, and it is difficult to reflect the characteristics of each monomer of nanomaterials.

Therefore, when exploring the variation law of the optical properties of nanomaterials with size, structure, and composition, we can only measure their comprehensive characteristics for empirical fitting, and it is difficult to obtain direct and accurate physical laws. The optical properties of nanomaterials are of great importance

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