Calibration method capable of aiming at S parameter amplitude-frequency characteristic of modularized probe

Abstract

The invention relates to a calibration method capable of aiming at the S parameter amplitude-frequency characteristic of a modularized probe. A transmission signal acquisition module with a modularized probe structure is inserted into a calibration backboard of a known characteristic parameter for testing, a connector on the calibration backboard is designed into single-row pins, a row-by-row test is carried out, and the S parameter amplitude-frequency characteristic from each connector pin to the radio frequency interface of the other end of the modularized probe is induced by cascade characteristics according to a test result. The calibration method can aim at the modularized probe of which one end is a multi-array pin connector for calibration and has a simple calibration way, meanwhile, the calibration backboard is designed to make modeling simple and accurate, and an accurate S parameter amplitude-frequency characteristic calibration result can be obtained.

Description

technical field [0001] The invention belongs to the field of signal testing and relates to a calibration method for the amplitude-frequency characteristics of S parameters of a modular probe. Background technique [0002] The modular probe is a conduction signal acquisition module for the modular integrated radio frequency rack. It can use the radio frequency interface to collect the conduction signals of multiple pins on the corresponding slot on the backboard of the integrated radio frequency rack through electronic switch array control. It is a connector with multiple rows of pins that can be inserted into the integrated radio frequency rack, and the other end is a radio frequency interface that can be connected to test equipment such as a spectrum analyzer. As a signal acquisition device, the modular probe needs to be calibrated for its S-parameter amplitude-frequency characteristics. [0003] Usually, the S-parameter calibration method for the test device is the SOLT c...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to overcome the problem that existing calibration methods cannot calibrate modular probes with multi-array pin connectors at one end, and propose a calibration method for the S-parameter amplitude-frequency characteristics of modular probes , it is only necessary to make a calibration backplane as a calibration part, and the calibration method is simple; in addition, since the connector sockets on the calibration backplane are set to a single row, the calibration backplane with only a single row of pin connector sockets is used to pair the connector sockets with multiple rows of pins The acquisition module of the connector plug is tested column by column, and each pin of the modular probe can be calibrated. At the same time, the modeling of the calibration backplane is simple and accurate, so that more accurate calibration results of the S-parameter amplitude-frequency characteristics can be obtained.

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