In-situ environment double-inclined sample rod of transmission electron microscope

Abstract

Transmission electron microscope in-situ environment double-tilt sample holder, mainly including hand handle, sample holder shaft, sample holder head end and sample cup for loading samples, sample cup and shaft fixed, The shaft is rotatably mounted on the head end of the sample rod, Set the drive between the shaft and the tip of the sample rod pivoted Shaft rotation system; the part where the sample cup is in contact with the sample is the electrode, one end of the sample is in contact with the positive electrode on the sample cup, the other end of the sample is in contact with the negative electrode on the sample cup, the positive electrode and the negative electrode are respectively connected to the handle through the wire Connect to the power interface on the The current is loaded on the positive electrode and the negative electrode of the sample cup, the sample is a metal sample, and the current flows through the sample itself through the electrodes at both ends of the sample cup. Due to the certain resistance of the sample itself, when the current is passed through, it will generate Joule heating effect and heat up by itself. The invention has the advantages of being able to heat the sample itself, pass through the atmosphere and realize observation with atomic resolution.

Description

technical field [0001] The invention relates to components of a transmission electron microscope, in particular to a biaxial tilting sample rod for a transmission electron microscope. technical background [0002] Transmission Electron Microscope (hereinafter referred to as TEM) is a large-scale experimental device for characterizing the microstructure of materials. It can simultaneously analyze the microstructure, crystal structure, and constituent elements of materials. The imaging principle is that the high-energy electron beam penetrates the sample, the transmitted electron beam is focused and amplified, and the detector is used to collect the signal and form an image. Modern high-resolution transmission electron microscopes can usually achieve atomic-level resolution, especially the rapid development of spherical aberration correction technology in the past five years makes the limit resolution of TEM reach 50 pm. However, it is often difficult to reach the limit resol...

AI Technical Summary

Problems solved by technology

[0006] However, there are two major defects in the design of this technical solution: first, the technology is complicated and the versatility is low

Not only is the overall technical solution complex, but also the two cannot be separated, so it is necessary to purchase this type of TEM

Second, the object of heating and ventilating the atmosphere is not targeted

However, none of the existing TEM sample holders can achieve this technical goal.

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