Test Management Method Based on Extensible Device Test Library
A technology of test management and test library, applied in the direction of electronic circuit testing, instruments, measuring electricity, etc., can solve problems such as increasing work difficulty and error probability, and achieve the effect of improving standardization and reducing work difficulty
Active Publication Date: 2018-12-04
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology
In this way, when users often switch between testing multiple types of devices, they have to choose again and again, which greatly increases the difficulty of work and the probability of errors.
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[0035] The indicator library contains all test indicators, and now some test indicators are listed, as follows:
[0036] {Output power, output frequency, modulated output power, gain, noise figure, gain compression, conversion loss, pulse width, harmonics, third-order intermodulation, waveform analysis, power consumption, work efficiency}; all test index names are included in brackets .
[0037] For example: [Power Consumption] indicator is used to characterize the power consumed by the device during operation.
[0038] The device library contains all currently supported device types, and now some device types are listed:
[0039] {Transceiver, Receiver, Mixer, Attenuator, LNA, Isolator};
[0040] All device names are listed in the above collection, and the test indicators corresponding to any device name are several indicators in the indicator library.
[0041] For example: the test index corresponding to the device whose device type name is LNA is {[Output Power], [Gain],...
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The invention discloses a test management method based on an extensible device test library, including loading device library and index library files; accessing test indicators in the indicator library, reading indicator names; creating an indicator object list, and storing the indicator names in the indicator object list middle; access the device type information in the device library, and read the device type name; create a device object list, and store the device type name in the device object list; read the test indicators corresponding to the device object list in step 5 in sequence, and The test index corresponding to the list establishes the reference of the index name corresponding to the index object list, and saves it in the test index list corresponding to the device object list; judges the selection of the device type name in the device object list, and judges the test index corresponding to the device type name Selected state; save the device type name in step 4 to the device library, and save the test index information corresponding to the device type name to the device library file in step 1.
Description
technical field [0001] The invention relates to the field of frequency domain / time domain signal testing, in particular to a test management method based on an expandable device test library. Background technique [0002] At present, there are many types of devices to be tested in the automatic test system for semiconductor monolithic integrated circuits. Each type of device has the characteristics of a relatively standardized test process and relatively uniform indicators, but the test index libraries of various devices are not the same. For example: the test indicators involved in the attenuator device type include operating frequency, attenuation, input power, attenuation accuracy and other indicators, and the test indicators involved in the low noise amplifier device type include operating frequency, power gain, saturation power, harmonics, clutter, 1dB compression point power, noise figure and other indicators. It can be seen that the two types of devices have both com...
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IPC IPC(8): G01R31/28
CPCG01R31/2856
Inventor 胡宝刚朱学波
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP