Method for generating test pattern vector for CPU device

A technology for testing graphics and devices, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc. It can solve problems such as complex source programs and cumbersome test procedures, and achieve the effects of simplifying test procedures, avoiding influence, and reducing complexity

Inactive Publication Date: 2016-11-23
湖北航天技术研究院计量测试技术研究所
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Usually, the test scheme of "writing source program and directly burning test" is adopted. Not only the source pr

Method used

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  • Method for generating test pattern vector for CPU device
  • Method for generating test pattern vector for CPU device
  • Method for generating test pattern vector for CPU device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0028] a. Write the source program:

[0029] Write the source program in assembly language according to the function of the CPU device;

[0030] b. Software simulation:

[0031] Use Keil simulation software to simulate the functions of each part of the CPU device to form the final source program, and convert the final source program into a .hex file;

[0032] c. Build a development system:

[0033] Build a development system consisting of an integrated circuit tester and an auxiliary circuit board, the auxiliary circuit board includes a latch, an external memory, and a socket for the CPU device to be tested, burn the .hex file into the external memory, and insert the CPU device tube The pin multiplexing function is divided into time sequences, and provides information such as power supply, clock, reset, and timing control;

[0034] d. Boot and run the final source program:

[0035] The final source program is provided by the external memory, the address signal is latched b...

Embodiment 2

[0041] a. Write the source program:

[0042] According to the function of the CPU device, use C language to write the source program;

[0043] b. Software simulation:

[0044] Use Keil simulation software to simulate the functions of each part of the CPU device. If the simulation result is inconsistent with the set result of the source program, modify the source program until the results of the two are consistent to form the final source program, and convert the final source program into a .hex file;

[0045] c. Build a development system:

[0046] Build a development system consisting of an integrated circuit tester and an auxiliary circuit board, the auxiliary circuit board includes a latch, an external memory, and a socket for the CPU device to be tested, burn the .hex file into the external memory, and insert the CPU device tube The pin multiplexing function is divided into time sequences, and provides information such as power supply, clock, reset, and timing control; ...

Embodiment 3

[0054] a. Write the source program:

[0055] Write the source program in assembly language according to the function of the CPU device;

[0056] b. Software simulation:

[0057] Use AVR studio simulation software to simulate the functions of each part of the CPU device to form the final source program, and convert the final source program into a .hex file;

[0058] c. Build a development system:

[0059] Build a development system consisting of an integrated circuit tester and an auxiliary circuit board, the auxiliary circuit board includes a latch, an external memory, and a socket for the CPU device to be tested, burn the .hex file into the external memory, and insert the CPU device tube The pin multiplexing function is divided into time sequences, and provides information such as power supply, clock, reset, and timing control;

[0060] d. Boot and run the final source program:

[0061]The final source program is provided by the external memory, the address signal is latc...

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Abstract

The invention relates to a method for generating a test graphic vector of a CPU device, comprising the following steps: using assembly language or C language to write a source program in sections; software simulation to form a final source program and a burnable file supported by a memory; building an integrated circuit tester A development system composed of an auxiliary circuit board; guide and run the final source program, output the result; collect and record the input and output information of the CPU to form the initial test graphic vector; get rid of the auxiliary circuit board, and simulate the external memory by the integrated circuit tester to generate the test Graphic vector. The present invention simulates the external memory through the integrated circuit testing machine, and transmits the program to the CPU according to the read and write sequence of the memory, which not only can effectively avoid the influence of peripheral devices, but also simplifies the test program, without prior programming of the CPU, and can directly Test on the machine. At the same time, the source program is written in sections, which not only reduces the complexity of the source program, but also can effectively locate the fault.

Description

technical field [0001] The invention relates to a method for generating graphic vectors, in particular to a method for generating graphic vectors for CPU device testing. Background technique [0002] Due to the high integration level and complex functions of CPU devices, according to the programming ideas of general logic circuits, it is impossible to compile test graphic vectors by analyzing the logic functions of devices. Therefore, the smallest system is often built for the CPU device to be tested for testing. At present, there are two main ways of testing CPU devices: one is to test the structure of the device, ask the manufacturer for a vector file, and then convert the vector file into a test vector. However, because the test vector contains the design idea of ​​the circuit structure, the designer often refuses to provide the vector file in order to protect its own rights and interests. The second is to test the function of the CPU device to be tested. Usually, the t...

Claims

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Application Information

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IPC IPC(8): G01R31/3181G01R31/3183
CPCG01R31/31813G01R31/318307G01R31/318371
Inventor 宋芳简力李永梅杨怡宋伟超罗向阳陈章涛袁云华赵永兴
Owner 湖北航天技术研究院计量测试技术研究所
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