General auto test system and general auto test method based on device under test (DUT) model

Abstract

The invention discloses a general auto test system based on a device under test (DUT) model. The general auto test system comprises a data storage controller, a test development controller, a monitoring display controller, a fault diagnosis controller, a test analysis controller, a test resource controller and an analogue simulation controller which are connected by a data bus controller; each controller is provided with a corresponding component. The invention further provides a method for the general auto test system. The method comprises the following steps of creating the DUT model; performing hardware selection and design of a conditioning circuit; creating a test resource model; performing software deployment; performing test development and configuration, and the like. The general automatic testing system disclosed by the invention can be compatible with a big data storage platform, and lays a technology foundation for data analysis and data mining; the deployment, development and extension difficulty of the testing system is greatly reduced, and the development cost and the time cost of the testing system are reduced; entire life-cycle management of test data is really realized, the adaptability of an ATS (Auto Test System) is improved, and the general range of the ATS system is widened.

Description

technical field [0001] The present invention relates to an automatic testing system and method, in particular to a general automatic testing system and method based on a model of a tested object. Background technique [0002] The traditional general-purpose automated test system (ATS / Auto Test System), most typically developed on the PAWS based on TXY of the United States and the SMART platform of Aerospace France, its core is to solve the independence of test procedures and test resources (hardware resources), and test Program portability and reusability protects investment in testing. The technical basis it relies on requires ATS to meet the IEEE 1226 ABBET (A Broad Based Environment for Test) standard and support ALTLAS language subsets, that is, different test signal libraries, and realize the independence of standard test resources through the standard interface of intelligent instruments. [0003] At present, the biggest disadvantage of the traditional general-purpose...

AI Technical Summary

Problems solved by technology

[0003] At present, the biggest disadvantage of the traditional general-purpose ATS is that there is no business system based on the technical architecture, and there is no direct support for the business. The testable design results are directly used as the system and method for ATS development input, which needs to be converted into the technical development requirements of PAWS or SMART development platform for development; if there is no unified test data model, it will not be able to support further development based on big data technology in the future. The need to develop test technology, at the same time, also leads to the need to develop a large number of program codes for test data acquisition, modeling, storage and access for each specific ATS

[0004] In addition, the traditional general-purpose ATS does not involve data specifications and standa

Images