Linear feature matching method and system

A technology of straight line features and matching methods, applied in instruments, character and pattern recognition, computer components, etc., can solve the problems of lack of versatility and high consistency of matching straight line attributes

Inactive Publication Date: 2017-01-04
中测高科(北京)测绘工程技术有限责任公司
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Problems solved by technology

[0004] The invention provides a straight line feature matching method and system, which solves the technical problem that the straight line feature matching in the prior art is only limited to the high consistency of matching straight line attributes and does not have universality

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  • Linear feature matching method and system
  • Linear feature matching method and system

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Embodiment Construction

[0028] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0029] Such as figure 1 As shown, it is a flowchart of a straight line feature matching method provided by an embodiment of the present invention, including:

[0030] Step 101, acquiring a digital image;

[0031] Step 102, performing feature point extraction and matching on the digital image using the scale-invariant feature transformation SIFT algorithm to obtain a set of matching points;

[0032] Step 103, using a Gaussian filter to filter and denoise the digital image;

[0033] Step 104, calculating the gradient magnitude and gradient direction of each pixel in the digital image, iterating the pixels in order of gradient magnitude from large to small, and grouping pixels with similar gradient directions into a unified area; ...

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Abstract

The invention relates to the field of computer graphics, and discloses a linear feature matching method and system. The method comprises the steps of acquiring a digital image; utilizing an SIFI algorithm to carry out feature point extraction and matching on the digital image; Gaussian filtering and eliminating noise; classifying pixels; acquiring a matching line candidate set; calculating an overlap part of a referenced line and a candidate matching line in the matching line candidate set; realizing line matching according to geometrical features and grey information of the line. The applicability of line feature matching is improved, and the requirement on the consistency of matching line attribute is reduced.

Description

technical field [0001] The invention relates to the field of computer graphics, in particular to a straight line feature matching method and system. Background technique [0002] Straight line features are the main contour features of artificial scenes such as buildings, and play a controlling role in the 3D model structure of buildings. In the picture, the straight line feature is a very important middle-level descriptor in the picture. Compared with the point feature, the straight line feature can better reflect the overall geometric topological relationship in the picture. In the overall straight line feature, even if part of the straight line is occluded and invisible, the remaining part can still provide enough information for the reconstruction of the 3D model of the building. For buildings, how to extract the straight line features of the building from the picture and realize the matching of the straight line features is the key to describe the structure of the three...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/46G06K9/62G06K9/40
CPCG06V10/30G06V10/462G06F18/22
Inventor 郑君王继周范荣双曹萌贺鹏艳景新超
Owner 中测高科(北京)测绘工程技术有限责任公司
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