Wave measurement apparatus for correcting wave characteristic parameters based on multi-parameters, and wave measurement method thereof

Abstract

The invention relates to a wave measurement apparatus for correcting wave characteristic parameters based on multi-parameters, and a wave measurement method thereof. According to the present invention, the sensor with characteristics of mature technology and low cost and other modules are used, and other complicated-design mechanical structures are not required, such that the structure design is simplified, and the cost is low; 1-4 groups of the independent and different multi-parameter sensors are used to perform the synchronous detection, wherein other sensors can be continuously used when one of the sensors fails while the whole detection data collection is not affected, such that the detection reliability and the fault tolerance of the whole equipment are improved; and the derivation is performed by using the traditional formula, the integrating and the secondary integrating are required to be used, and the derivation is non-linear so as to easily produce the error accumulation, while the support vector regression model is used, the target function is fitted by using the non-linear kernel function, the non-linear kernel function is non-linear, the input error is subjected to compatibility, and the calculation is the one calculation, such that the assumptions and the accumulative errors in the derivation are avoided, and the problems of the nonlinearity and the error accumulation of the wave characteristic data derivation are solved.

Description

technical field [0001] The invention relates to a wave measuring device and method for correcting wave characteristic parameters based on a multi-parameter sensor. Background technique [0002] At present, products with the same function mainly adopt pressure wave measurement technology, acoustic wave measurement technology, optical wave measurement technology, and remote sensing wave measurement technology. [0003] The pressure underwater measuring instrument uses a high-resolution sensor to measure the pressure fluctuation caused by the surface wave. According to the linear wave theory, the relationship between the wave surface and the fluctuating pressure is obtained. The relationship between the pressure wave and the surface wave quality inspection is still semi-theoretical and semi-empirical. The accuracy of the inverted surface wave is still questioned by various parties. Observation studies even show that the conversion coefficient is different in different sea areas...

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Problems solved by technology

[0009] Existing products in the same field, due to the use of complex mechanical structures, increase the complexity and cost of design and manufacture, as well as volume weight; due to the use of traditional methods, it is difficult to control the cost, which greatly affects the scope of use; Due to the large size, the area protruding from the water surface is large, and it is greatly affected by wind and other environments, which is prone to data deviation; due to the use of complex electronic and mechanical equipment, the power consumption is large, and the...

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