Metallized film defect detecting and cropping device

Abstract

The invention relates to a metallized film defect detecting and cropping device, and belongs to the technical field of a capacitor detecting device. The metallized film defect detecting and cropping device comprise a light transmitting plate, a light-emitting device is arranged below the light transmitting plate, the metallized film is laid on the light transmitting plate, light emitted from the light-emitting device penetrates through the light transmitting plate successively and shines the reverse side of the metallized film, a laser emitting device and a laser receiving device of the light transmitting plate are symmetrically arranged on two sides of the metallized film respectively, and the laser emitting device on one side of a detecting platform makes the laser reflected onto the laser receiving device after emitting the laser to the metallized film. According to the metallized film defect detecting and cropping device, the laser emitting device and the laser receiving device are arranged on two sides of the metallized film so as to conduct detection on film thickness, when the film thickness is abnormal, a receiving position of the laser receiving device changes, and a corresponding alarming reminding is generated so as to judge the quality of a capacitor film; then, the light-emitting device can use the backlight to show defects of the metallized film, thus distinguishing rate of the defects can be increased.

Description

technical field [0001] The invention relates to a metallized film defect detection-cutting device, which belongs to the technical field of capacitor detection devices. Background technique [0002] At present, capacitors are widely used in the fields of power electronics, communication facilities and rail transportation. With the development of science and technology, capacitors have become indispensable electronic components to promote the upgrading of the above industries due to their good electrical performance and high reliability. Among them Due to its small size and high safety, film capacitors have greatly promoted the development of capacitor technology. In the prior art, the common manufacturing method of film capacitors is to overlap metal film and plastic films such as polyethylene, polypropylene, polystyrene or polycarbonate from both ends, and then wind it into a cylindrical metallized film electrode. Then it is placed in the capacitor case, injected with insul...

AI Technical Summary

Problems solved by technology

It is ideal if these two types of thickness measuring equipment can be used together, but the online thickness measuring equipment detection equipment is relatively complicated, and the non-contact detection is used, which is prone to large data fluctuations caused by poor surface smoothness of the film. Non-on-line thickness measurement equipment can provide contact measurement method, which effectively makes up for the deficiency of online thickness measurement

At present, most of the on-line inspection equipment is carried out by manual visual inspection. This inspection method requires a large investment of manpower, and it is difficult to detect defects with insignificant thickness changes. There are potential safety hazards in the quality of capacitor products.

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