Embedded board automatic test system and method based on visual inspection technology
An automatic test system and visual inspection technology, applied in the direction of non-contact circuit test, electronic circuit test, etc., can solve the problem of unfavorable embedded board fault discovery, affecting the efficiency of embedded board test, insufficient human eye observation and Fast and other issues, to improve test efficiency, improve reliability and production efficiency, and solve the effects of difficulty in discovery and memory
Active Publication Date: 2019-04-26
CHENGDUSCEON TECH
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Problems solved by technology
[0002] The test of the existing embedded boards is basically carried out by means of testing software and human eye observation under normal conditions. This test method makes the boards unable to be effectively tested in routine tests such as vibration and temperature, and the test time is relatively long , the human eye observation is not careful and fast enough, especially for low-probability board failures and problems generated in routine tests, it is not easy to be found, and it is not easy to trace the failure phenomenon, which is not conducive to the discovery of embedded board failures
In addition, in the testing process of the existing embedded boards, usually only one board can be tested for each test, and the board needs to be replaced after the test is completed. The process of replacing the board is time-consuming and laborious, which seriously affects the performance of the embedded board. test efficiency
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[0043] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following description.
[0044] Such as figure 1 As shown, the embedded board automatic test system based on visual inspection technology includes board fixtures, channel gating devices, camera devices, analysis and processing equipment and network connection equipment.
[0045] The board fixture is used for fixing the embedded board to be tested, and transferring the power signal and the test signal.
[0046] The board fixture includes a temperature test fixture and a vibration test fixture, which can meet the requirements of different experimental conditions. In this embodiment, the board clamp is provided with a board fixing device for fast insertion of the board, and multiple embedded boards, such as 8, can be fixed at the same time on one board clamp. The po...
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The invention discloses an embedded board card automatic test system based on a visual detection technology. The embedded board card automatic test system comprises a board card clamp which is used for fixing a tested embedded board card; a channel gating device which is used for receiving a test command and transmitting a test signal to the tested embedded board card according to the test command, receiving the test data of the tested embedded board card and generating the state image of the tested embedded board card according to the test data and transmitting the test data; a photographing device which is used for acquiring the state image of the tested embedded board card and transmitting the acquired state image; analysis and processing equipment which is used for transmitting the test command, receiving the test data and the state image and analyzing and processing the test data and the state image; and network connection equipment which is used as a delivery channel for the network port data of the analysis and processing equipment and the tested embedded board card. The display interface of the embedded board card is automatically tested by using the visual detection technology so that the test reliability and efficiency can be enhanced.
Description
technical field [0001] The invention relates to the technical field of embedded board testing, in particular to an embedded board automatic testing system and method based on visual detection technology. Background technique [0002] The test of the existing embedded boards is basically carried out by means of testing software and human eye observation under normal conditions. This test method makes the boards unable to be effectively tested in routine tests such as vibration and temperature, and the test time is relatively long , The human eye observation is not careful and fast enough, especially for low-probability board failures and problems generated in routine tests, it is not easy to be found, and it is not easy to trace the failure phenomenon, which is not conducive to the discovery of embedded board failures. In addition, in the testing process of the existing embedded boards, usually only one board can be tested for each test, and the board needs to be replaced aft...
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IPC IPC(8): G01R31/309
CPCG01R31/309
Inventor 钟涛彭毅吴啸宇王斌儒喻文彬王小军
Owner CHENGDUSCEON TECH