Semiconductor laser degradation testing and service life prediction experimental platform

Abstract

The invention provides a semiconductor laser degradation testing and service life prediction experimental platform. The semiconductor laser degradation testing and service life prediction experimental platform comprises a computer analysis system, a semiconductor laser driving control system and a data transmission system; the computer analysis system receives the state data of a semiconductor laser through the data transmission system and performs calculation and analysis to realize functions such as curve drawing, degradation testing and service life prediction; and the semiconductor laser driving control system receives a parameter setting and mode control data packet through the data transmission system and analyzes the parameter setting and mode control data packet so as to control the modulation current, bias current, optical power and temperature of the semiconductor laser. With the semiconductor laser degradation testing and service life prediction experimental platform of the invention adopted, the degeneration characterization parameter of the semiconductor laser can be tested under a premise that the normal modulation work of the semiconductor laser is not affected, and the current, voltage and temperature stress during the operation of the semiconductor laser can be acquired, so that the service life of the semiconductor laser can be predicted. The experimental platform can be used for semiconductor laser factory delivery tests and experiments and teaching researches of optoelectronic device characteristics and laser communication.

Description

technical field [0001] The invention relates to an integrated test and analysis platform; in particular, it relates to a semiconductor laser degradation test and life prediction experiment platform. Background technique [0002] Semiconductor lasers are widely used in fields such as laser communication, material processing, medical treatment and military affairs, which have a profound impact on national economy and national defense construction. As the core component of optical equipment, the degradation and lifetime of semiconductor lasers are one of the key considerations in the design and use process. In the design and production stages, the performance of semiconductor lasers is mainly evaluated through reliability, and the performance of the products is determined accordingly; but in the use stage, with the different conditions and environments of semiconductor lasers, their degradation mechanism and service life are also relatively different from the factory. The aver...

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Problems solved by technology

[0004] The existing degradation test platform and life prediction method mainly have the following deficiencies: 1) When the parameter measurement system is testing the degradation parameters, the semiconductor laser is in an abnormal working state, which affects the overall test effect to a certain extent; 2) The life prediction adopts the accelerated life experiment data for fitting analysis. This prediction method is mainly aimed at the semiconductor laser under the single current working condition, but the semiconductor laser in actual work may be affected by the alternating current and ambient temperature stress, so it is not suitable to use this method. 3) There is no effective connection between the life prediction method and the degradation mechanism, and there is no platform for degradation parameter testing and service life prediction algorithm

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