Automatic method for testing RAID (redundant array of independent disks) IO (input/output) LED (light-emitting diode) lamp in memory

Abstract

The invention discloses an automatic method for testing an RAID (redundant array of independent disks) IO (input / output) LED (light-emitting diode) lamp in a memory, and relates to the technical field of memory testing. Automated scripts written in a PERL (practical extraction and reporting language) under linux are used, an instruction is given to IO through an IO serial port to control on, off and flash of the LED lamp, and LED function testing of the RAID IO is performed. Unnecessary man-machine interaction processes are decreased, testing operation is simple and convenient, mass testing can be performed simultaneously, resources such as testing manpower, time and cost are saved, testing efficiency and accuracy are improved, testing coverage ratio is quite high, any defective products can be intercepted, problems are accurately positioned, and product output quality is ensured.

Description

technical field [0001] The invention relates to memory testing technology, in particular to an automatic method for testing RAID IO led lights in memory. Background technique [0002] Memory is a memory device used to save information in modern information technology. Its concept is very broad and has many levels. In a digital system, as long as it can store binary data, it can be a memory; in an integrated circuit, a circuit with a storage function without a physical form is also called a memory, such as RAM, FIFO, etc.; In the system, storage devices in physical form are also called storage devices, such as memory sticks and TF cards. All information in the computer, including input raw data, computer programs, intermediate running results and final running results are stored in the memory. It deposits and retrieves information according to the location specified by the controller. With the memory, the computer has the memory function to ensure normal work. The memory ...

AI Technical Summary

Problems solved by technology

[0004] At present, when testing the functions of RAID IO LED lights in most storage devices, a large number of human operations are required to participate, which inevitably leads to errors caused by human factors, resulting in inaccurate testing, and failure to intercept problematic products in time, thereby affecting the entire system. product quality

At the same time, a large number of manual testing operations lead to low testing efficiency and low testing coverage, which cannot meet the requirements of product testing efficiency and effect

Images